Abstract:Soft-errors (SEs) and delay faults (DFs) frequently occur in modern high-density, high-speed, low-power VLSI circuits. Therefore, SE hardened design and DF testing are essential. This thesis introduces two novel methods for soft-error detection and delay fault propagation in nanometre technology. A new idea is proposed to propagate those delay faults that are not causing logic failure at the site of the defect, but the delay makes the circuit more prone to soft-errors that manifest the effect of delay faults. … Show more
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