2016
DOI: 10.1107/s1600577516015289
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Fast X-ray microfluorescence imaging with submicrometer-resolution integrating a Maia detector at beamline P06 at PETRA III

Abstract: The high brilliance of third-generation synchrotron sources increases the demand for faster detectors to utilize the available flux. The Maia detector is an advanced imaging scheme for energy-dispersive detection realising dwell times per image-pixel as low as 50 µs and count rates higher than 10 × 10 s. In this article the integration of such a Maia detector in the Microprobe setup of beamline P06 at the storage ring PETRA III at the Deutsches Elektronen-Synchrotron (DESY) in Hamburg, Germany, is described. T… Show more

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Cited by 49 publications
(50 citation statements)
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“…Elements down to atomic number 15 (phosphorus) are detected. The integration of the detector system at the beamline P06 has been described elsewhere . Accurate positioning and motion control of the sample are achieved by an encoder‐controlled stage system providing 50 mm travel range with 20 nm precision.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Elements down to atomic number 15 (phosphorus) are detected. The integration of the detector system at the beamline P06 has been described elsewhere . Accurate positioning and motion control of the sample are achieved by an encoder‐controlled stage system providing 50 mm travel range with 20 nm precision.…”
Section: Methodsmentioning
confidence: 99%
“…In this paper, we propose a different method for the identification of trace minerals and metals in their undisturbed histological context. Unstained sections are imaged by fast‐scanning high‐resolution X‐ray fluorescence (XRF) analysis . XRF is a non‐destructive technique, and the same sample can subsequently be used for ultrastructural analysis by light microscopy (LM) or transmission electron microscopy (TEM), and also nanoscopic X‐ray analyses [X‐ray diffraction, X‐ray absorption near edge structure and scanning coherent diffraction imaging (ptychography)].…”
Section: Introductionmentioning
confidence: 99%
“…The general setup with the Maia detector mounted in backscattering geometry at the microfocus endstation of the P06 beamline is described in detail elsewhere (Boesenberg et al, 2016). A schematic of the setup at the beamline is shown in Fig.…”
Section: à4mentioning
confidence: 99%
“…The experiments were conducted in fluorescence mode with a sub-micrometer focused beam scanning the sample in two dimensions using a Maia detector at the P06 beamline, PETRA III, Deutsches Elektronen-Synchrotron (DESY), Germany (Boesenberg et al, 2016). The set-up was characterized with a specially designed Ta/Ta 2 O 5 test pattern and a geological thin section, directly comparing conventional measurements with the energy as the outer axis with fast XANES results with the energy as the inner scanned axis.…”
Section: Introductionmentioning
confidence: 99%
“…Now two Maia 384 detectors are in routine application at the XFM beamline [7], one for µm-scale mapping and one for macro-scale mapping of cultural heritage objects. Maia 384 detectors are also in use for SXRF element mapping at the P06 beamline, Petra III synchrotron, DESY in Hamburg [8], the SRX beamline, NSLS-II in New York and the CHESS synchrotron at Cornell University. The large solid-angle and collection efficiency of the Maia 384 detector has been exploited in a pair of laboratory XRF mapping systems called Maia Mapper at CSIRO for high definition element mapping of rock samples and drill core at 30 µm spatial resolution over spatial scales up to 500 mm [9].…”
mentioning
confidence: 99%