Fast spiral-scan atomic force microscopy

Abstract

In this paper, we describe a new scanning technique for fast atomic force microscopy. In this method, the sample is scanned in a spiral pattern instead of the well established raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x-axis and y-axis of an atomic force microscope (AFM) scanner respectively. The use of the single tone input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device and with relatively small control efforts. Experimental results obtained by implementing this technique on a commercial AFM indicate that high-quality images can be generated at scan frequencies well beyond the raster scans.

Design, Modeling, and FPAA-Based Control of a High-Speed Atomic Force Microscope Nanopositioner

“…Due to its mechanical symmetry in X-Y plane, the nanopositioner can be operated in both raster and nonraster scan modes [30], [31] [32]. The device consists of a X-Y nanopositioning stage and a Z nanopositioning stage mounted onto the X-Y platform.…”

Wide-area scanner for high-speed atomic force microscopy

“…To overcome this adverse effect, modified lateral scan waves, such as sinusoidal, 19 spiral, 23 cycloid, 24 and Lissajous 25 waves have been proposed. Sinusoidal scanning is the simplest solution, but both the left and right end areas of an image are greatly distorted.…”

Control Methods in Data-Storage Systems

“…In particular, two methods that have been proposed are based on tracking spiral [235], [236] and cycloid-like trajectories [237]. The main advantage of these methods is that for a mechanical scanner it is much easier to track a smooth trajectory, rather than a raster pattern with sharp corners.…”