2020
DOI: 10.1017/s1431927620024307
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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization

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Cited by 29 publications
(22 citation statements)
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References 97 publications
(154 reference statements)
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“…Such techniques are known to work well even with noisy data, so it is highly likely that the improved data quality from the direct electron detector will allow the successful application of such methods at very low electron doses of a few e − /Å 2 , just as was recently performed using scanned electron nanodiffraction for a beam-sensitive halide perovskite (Doherty et al, 2020). Further data analysis could be performed in some cases using different approaches, by integrating the intensity of specific parts of a diffraction pattern (possibly with background subtraction), as has been done in other analyses of pixelated detector data from STEM (Nord et al, 2019a(Nord et al, , 2019bPaterson et al, 2020). This could be done, for example, to study the ordering or domain variant selection in materials, by the appearance and orientation of superlattice spots.…”
Section: Discussionmentioning
confidence: 99%
“…Such techniques are known to work well even with noisy data, so it is highly likely that the improved data quality from the direct electron detector will allow the successful application of such methods at very low electron doses of a few e − /Å 2 , just as was recently performed using scanned electron nanodiffraction for a beam-sensitive halide perovskite (Doherty et al, 2020). Further data analysis could be performed in some cases using different approaches, by integrating the intensity of specific parts of a diffraction pattern (possibly with background subtraction), as has been done in other analyses of pixelated detector data from STEM (Nord et al, 2019a(Nord et al, , 2019bPaterson et al, 2020). This could be done, for example, to study the ordering or domain variant selection in materials, by the appearance and orientation of superlattice spots.…”
Section: Discussionmentioning
confidence: 99%
“…One such example is the work by NanoMEGAS to incorporate a Medipix3 DED into their DigiSTAR precession system in order to enable high fidelity recording of diffraction patterns in scanning PED (SPED) applications, as has been demostrated in recent work (MacLaren et al, 2020). Additional benefits brought about by the use of DEDs in SPED will be discussed in Part II of this work (Paterson et al, 2020b). We note here, however, that the properties of the 4D dataset obtained by such a system are in many ways equivalent to those of 4D non-SPED datasets, and so many of the same issues of data access, storage, and processing apply here too.…”
Section: Merlin Equipped Scanning Precession Electron Diffraction Sysmentioning
confidence: 99%
“…processing are covered in Part II of this work (Paterson et al, 2020b), while field mapping will be covered in Part III.…”
Section: Live Data Processingmentioning
confidence: 99%
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