“…Such techniques are known to work well even with noisy data, so it is highly likely that the improved data quality from the direct electron detector will allow the successful application of such methods at very low electron doses of a few e − /Å 2 , just as was recently performed using scanned electron nanodiffraction for a beam-sensitive halide perovskite (Doherty et al, 2020). Further data analysis could be performed in some cases using different approaches, by integrating the intensity of specific parts of a diffraction pattern (possibly with background subtraction), as has been done in other analyses of pixelated detector data from STEM (Nord et al, 2019a(Nord et al, , 2019bPaterson et al, 2020). This could be done, for example, to study the ordering or domain variant selection in materials, by the appearance and orientation of superlattice spots.…”