2006
DOI: 10.1063/1.2221516
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Fast lifetime measurements of infrared emitters using a low-jitter superconducting single-photon detector

Abstract: We use a superconducting single-photon detector with less than 40Hz dark count rate to measure spontaneous emission lifetimes of quantum wells emitting light at wavelengths of 935 and 1245nm. The timing jitter of the measurement system—which includes the detector and all other electronic and optical components—is 68±3ps. We demonstrate how the infrared sensitivity and Gaussian temporal response function of this superconducting detector present clear advantages over conventional detector technologies.

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Cited by 87 publications
(56 citation statements)
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“…electron-hole pair generation and the photoelectric effect, exploiting superconductivity instead. They have been developed and used for astronomical applications, as reviewed recently [151], but some of these detectors have also been used for the detection of instrumental responses of laser pulses and fluorescence decays via TCSPC [152,153].…”
Section: Superconducting Detectorsmentioning
confidence: 99%
“…electron-hole pair generation and the photoelectric effect, exploiting superconductivity instead. They have been developed and used for astronomical applications, as reviewed recently [151], but some of these detectors have also been used for the detection of instrumental responses of laser pulses and fluorescence decays via TCSPC [152,153].…”
Section: Superconducting Detectorsmentioning
confidence: 99%
“…For example, InGaAs/ InP SPADs have detection efficiencies greater than 10% at 1550 nm, but suffer from high dark count rates and the deleterious effects of afterpulsing, which generally result in a need for both gated operation and much reduced overall count rates [11] compared with Si-based SPADs. In this Letter we present ranging results obtained with a nanopatterned superconducting single-photon detector (SSPD), which has demonstrated single-photon sensitivity at longer wavelengths with lower jitter of 68 ps FWHM and a Gaussian profile [12]. We estimate the minimum resolvable surface separation using the same approach employed previously [10].…”
mentioning
confidence: 99%
“…The first practical application of these detectors was for non-invasive testing and debugging of CMOS integrated circuits [13,14], while recently, they were implemented for fast lifetime measurements of quantum well structures emitting IR radiation [15], and for determination of spontaneous emission lifetimes of InAs quantum dot single photon sources [3]. Our SSPDs are also very attractive for QC protocols due to low dark counts, in combination with the fast recovery time, and hence, high maximal counting rate [16].…”
Section: Introductionmentioning
confidence: 99%