Fast heavy ion induced desorption

Wien, K.

doi:10.1080/10420158908220529

Cited by 77 publications

(16 citation statements)

References 105 publications

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“…Sputter and desorption yield measurements from 1 m thick targets in the regime of electronic energy loss have shown that both scale with the electronic energy loss dE e =dx n to the power of n 1-3. This was observed for targets of frozen gases [2 -5], for sputtering from micron-thick coatings of protein [6,7], and for desorption of nitrogen from a conductor (carbon) by 6-13 MeV=u ions (u is the nucleon mass) [8,9]. Electronic sputtering and desorption from 1 m thick targets is found to vary with the ion impact angle from normal, , as 1=cos m to the first or higher power of m [5,10].…”

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Heavy-Ion-Induced Electronic Desorption of Gas from Metals

et al. 2007

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During heavy-ion operation in several particle accelerators worldwide, dynamic pressure rises of orders of magnitude were triggered by lost beam ions that bombarded the vacuum chamber walls. This ioninduced molecular desorption, observed at CERN, GSI, and BNL, can seriously limit the ion beam lifetime and intensity of the accelerator. From dedicated test stand experiments we have discovered that heavy-ion-induced gas desorption scales with the electronic energy loss (dE e =dx) of the ions slowing down in matter; but it varies only little with the ion impact angle, unlike electronic sputtering. DOI: 10.1103/PhysRevLett.98.064801 PACS numbers: 41.75.Ak, 34.50.Dy, 79.20.Rf Energetic ions incident on matter sputter target material and also desorb gas from the target surface. The sputter and desorption yields (number of sputtered or desorbed particles per ion impact) are known to be linked to the energy loss of the projectile inside the target. Two energy loss regimes, nuclear and electronic, have been known for decades. An example for potassium ions impacting onto stainless steel, calculated with the SRIM code [1], is shown in Fig. 1. Here for low projectile energies the nuclear energy loss dominates and for higher energies the electronic energy loss dominates the total energy loss. Sputter and desorption yield measurements from 1 m thick targets in the regime of electronic energy loss have shown that both scale with the electronic energy loss dE e =dx n to the power of n 1-3. This was observed for targets of frozen gases [2 -5], for sputtering from micron-thick coatings of protein [6,7], and for desorption of nitrogen from a conductor (carbon) by 6-13 MeV=u ions (u is the nucleon mass) [8,9]. Electronic sputtering and desorption from 1 m thick targets is found to vary with the ion impact angle from normal, , as 1=cos m to the first or higher power of m [5,10].Our research was motivated by the copious gas desorption that results from lost heavy ions striking particle accelerator vacuum chambers leading to dynamic pressure rises which limit the beam intensity in a number of heavyion accelerators [11]. Related work dates back more than 30 years, when a vacuum instability in the Intersecting Storage Rings (ISR) at CERN was identified above a critical beam current [12]. Recent requirements for orders of magnitude increase in beam intensity have motivated our search for further understanding and mitigation mechanisms. In preparation for the heavy-ion program of the Large Hadron Collider at CERN, beam-loss induced molecular desorption was intensively studied in ultra-highvacuum chambers at CERN's Heavy-Ion Accelerator (LINAC 3) [13] and the Super Proton Synchrotron (SPS) [14]. Large effective desorption yields of up to 2 10 4 molecules=Pb 53 ion (4:2 MeV=u) and 3:7 10 4 molecules=In 49 ion (158 GeV=u) were measured for ions impacting under various angles [ 0 (perpendicular), 84.8 , 89.2 at LINAC 3, and 88.3 at the SPS] onto stainless steel samples which were chemically cleaned, 950 C vacuum fired, and in situ baked at...

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Heavy-Ion-Induced Electronic Desorption of Gas from Metals

et al. 2007

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“…Whereas the characteristics of latent damage tracks have been determined by various physical methods ex situ, long after the impacting event [14], the study of the sputtered material can in principle provide "real time," in situ information on the complex physical and chemical processes occurring in ion tracks [15][16][17]. Here we demonstrate the use of high resolution time-of-flight mass spectrometry of the ionic ejecta [13,17] to reconstruct the track of an MeV ion in an organic polymer on the picosecond time scale.…”

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“…When fast ions interact with dielectric materials, a trail of radiation damage in the bulk (damage tracks) [3] as well as material erosion of the surface (electronic sputtering) are observed [12,13]. Whereas the characteristics of latent damage tracks have been determined by various physical methods ex situ, long after the impacting event [14], the study of the sputtered material can in principle provide "real time," in situ information on the complex physical and chemical processes occurring in ion tracks [15][16][17].…”

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Measurement of MeV Ion Track Structure in an Organic Solid

et al. 1996

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“…In this case, the main cause of surface roughening is believed to be surface erosion or deposition, while surface smoothing appears to be due to surface diffusion or viscous flow. In our studies (E = 20 MeV), the calculated number of sputtered atoms per incident ion under highenergy heavy ion irradiation is less than 1 for heavy ions [31,32]. Moreover, surface smoothing and roughening appear at a relatively low temperature, indicating that macroscopic thermal effect and diffusion are unimportant.…”

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Viscous surface flow induced on Ti-based bulk metallic glass by heavy ion irradiation

Zhang

et al. 2016

Applied Surface Science

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a b s t r a c tTi-based bulk metallic glass was irradiated by a 20 MeV Cl 4+ ion beam under liquid-nitrogen cooling, which produced remarkable surface smoothing and roughening that respectively correspond to normal and off-normal incidence angles of irradiation. Atomic force microscopy confirms two types of periodic ripples distributed evenly over the rough glass surface. In terms of mechanism, irradiation-induced viscosity agrees with the theoretical prediction for metallic glasses near glass transition temperature. Here, a model is introduced, based on relaxation of confined viscous flow with a thin liquid-like layer, that explains both surface smoothing and ripple formation. This study demonstrates that bulk metallic glass has high morphological instability and low viscosity under ion irradiation, which assets can pave new paths for metallic glass applications.

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Fast heavy ion induced desorption

Cited by 77 publications

References 105 publications

Heavy-Ion-Induced Electronic Desorption of Gas from Metals

Heavy-Ion-Induced Electronic Desorption of Gas from Metals

Measurement of MeV Ion Track Structure in an Organic Solid

Viscous surface flow induced on Ti-based bulk metallic glass by heavy ion irradiation

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