Fast Fourier transform techniques for efficient simulation of Z-scan measurements

Hughes, S.; Burzler, J. M.; Spruce, G.; Wherrett, B. S.

doi:10.1364/josab.12.001888

Cited by 51 publications

(18 citation statements)

References 24 publications

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“…Recently, the split step BPM 18,19 has been successfully applied to Z-scan studies with arbitrary beam shape and sample thickness. Therefore, we have adapted this procedure to model the beam evolution while it propagates in NLO samples.…”

Section: Theorymentioning

confidence: 99%

“…This method has been widely used to evaluate the light propagation inside waveguides, and recently it has been shown that even with relative large propagation steps, accurate results can be obtained in Z-scan studies. 18,19 For a single frequency three-dimensional wave, the scalar Helmholtz equation can be written as 21…”

Section: Theorymentioning

confidence: 99%

“…16 and 17 with the split step BPM, which was previously applied only to the conventional Z scan. 18,19 This combination allows us to analyze the results of Z-scan experiments when arbitrary spatial beam distribution and sample thickness, are used. In addition, by applying the split step BPM, the evolution of the optical beam distribution inside the cell containing the nonlinear material may be determined directly from the far field patterns.…”

Section: Introductionmentioning

confidence: 99%

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Two-dimensional Z scan for arbitrary beam shape and sample thickness

Chen

Oulianov

Tomov

et al. 1999

Journal of Applied Physics

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A two-dimensional Z-scan technique has been developed using a two-dimensional charge-coupled device (CCD) detector to study the nonlinear optical properties and beam profile evolution within optical limiting devices. Using the split step beam propagation method, the far field pattern at each Z position can be calculated precisely for any arbitrary beam shape and sample thickness. A two-dimensional far field pattern is recorded by the CCD detector, and the evolution of the beam distribution inside the nonlinear optical medium can be obtained directly. This technique has been applied to study the nonlinear optical parameters and laser beam profiles in nonlinear liquids. We have used thin and thick samples and Gaussian, top-hat and split Gaussian beam distributions, and the experimental results agreed very well with the calculation. This technique also offers a simple and accurate means for optimizing the design of optical limiting devices.

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Section: Theorymentioning

confidence: 99%

Section: Theorymentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Two-dimensional Z scan for arbitrary beam shape and sample thickness

Chen

Oulianov

Tomov

et al. 1999

Journal of Applied Physics

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“…The Fresnel-Kirchoff diffraction integral describing the transformation of the probe field distribution from the exit of the NLM 3to the far-field (i.e., to the aperture plane) could be simplified [17], [25] to a Fourier-transformation integral. At each local time within the probe pulse, the 2-D Fourier transformations (in space) are expanded over grid points.…”

Section: Numericalmodelmentioning

confidence: 99%

Experimental demonstration of pulse shaping and shortening by spatial filtering of an induced-phase-modulated probe wave

Dreischub

Buchvarov

Eugenieva

et al. 1997

IEEE J. Quantum Electron.

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“…A model that considers the nonlocal feature of the nonlinear response by a thin sample with nonlinear refraction was presented in [19], where the nonlocal response was depicted by an m parameter. The model calculates the electric field profile at the exit of the nonlinear media and then numerically calculate its Fast Fourier Transform [20], to obtain the far field intensity distribution. In order to complete this model in [21] was discussed the influence of the nonlocality in materials with simultaneous nonlinear refraction and absorption; finally analytical expressions were presented for the normalized intensity of z-scan curves for arbitrary phase changes.…”

Section: Introductionmentioning

confidence: 99%

Z-scan for thin media with more than one nonlocal nonlinear response

et al. 2016

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A model to characterize the response of a thin media that can exhibit more than one nonlocal nonlinear response when it is illuminated with a Gaussian beam in a z-scan experiment is proposed. The model considers that these nonlocal contributions can be treated as independent contributions in the refractive or absorptive nonlinear response. Numerical results for two nonlocal nonlinear contributions with different magnitudes between them are presented. Experimental results obtained from a hydrogenated amorphous silicon sample are used to corroborate this model.

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Fast Fourier transform techniques for efficient simulation of Z-scan measurements

Cited by 51 publications

References 24 publications

Two-dimensional Z scan for arbitrary beam shape and sample thickness

Two-dimensional Z scan for arbitrary beam shape and sample thickness

Experimental demonstration of pulse shaping and shortening by spatial filtering of an induced-phase-modulated probe wave

Z-scan for thin media with more than one nonlocal nonlinear response

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