Fast Fault Simulation to Identify Subcircuits Involving Faulty Components

Tasic, B.; Dohmen, J.J.; Maten, ter Ejw Jan; Beelen, Tgj Theo; Janssen, Hhjm Rick; Schilders, W.H.A.; Günther, Michael

doi:10.1007/978-3-319-23413-7_49

Cited by 1 publication

(3 citation statements)

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“…E.g., in [4], [26], [27] we added linear bridges (resistors) to the circuit. For each fault, only one element is added to the original, golden circuit.…”

Section: Fault Simulationmentioning

confidence: 99%

“…As in [27] we consider the faulty elements represented by adding linear conductivities to the circuit 1 . In [26] also the effect of additional linear capacitors was considered. However, the main interest is in adding linear conductivities.…”

Section: Fault Simulationmentioning

confidence: 99%

“…However, for simplicity, we just used (11), after ignoring the O(·) terms at the right-hand side. For expressions when dealing with capacitors we refer to [26]. The advantage of the right-hand side in (11) is that it is independent of the solution x k p at the previous time steps.…”

Section: Fault Simulationmentioning

confidence: 99%

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Fast Time-Domain Simulation for Reliable Fault Detection

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Proceedings of the 2016 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE)

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Abstract-Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to the nominal, "golden", design of an electronic circuit. By fault simulation we simulate all situations: a huge number of new connections and each with many different values, up to the regime of large deviations, for the newly added element. We also consider "opens" (broken connections). A strategy is developed to efficiently simulate the faulty solutions until their moment of detection. We fully exploit the hierarchical structure of the circuit. Fast fault simulation is achieved in which the golden solution and all faulty solutions are calculated over the same time step.

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“…E.g., in [4], [26], [27] we added linear bridges (resistors) to the circuit. For each fault, only one element is added to the original, golden circuit.…”

Section: Fault Simulationmentioning

confidence: 99%

Section: Fault Simulationmentioning

confidence: 99%