Fast extended test access via JTAG and FPGAs

Devadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund

doi:10.1109/test.2009.5355668

Cited by 14 publications

(3 citation statements)

References 5 publications

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“…This technique was first published several years ago [1], and the technology has continued to be developed upon for each new product. Others in industry are working on having FPGAs improve test times, including enhancements to standard boundary scan methodologies [2] [3].…”

Section: Previous Workmentioning

confidence: 99%

FPGA-based universal embedded digital instrument

Ferry

2013

2013 IEEE International Test Conference (ITC)

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In order to test products, a multi-purpose digital instrument has been developed which can be completely embedded within on-board FPGAs. This instrument incorporates numerous features such as specialized triggering, fault capture, and pattern edge placement. To increase usability, pattern generation and protocol-aware features are included within its small footprint. The applications of the embedded instrument can include design verification, production test, and fault diagnostics in a simple and low resource implementation.

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Section: Previous Workmentioning

confidence: 99%

FPGA-based universal embedded digital instrument

Ferry

2013

2013 IEEE International Test Conference (ITC)

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“…The approach is based on connected logic functions implemented inside the FPGA, interfacing the test bus directly to the I/O cells. This known process [2] makes it possible to implement new features on every boundary scan based system that contains an FPGA. The general approach is to implement functions inside the FPGAs programmable logic to connect higher level functionality to its I/O pins to support testing of the connected components.…”

Section: Approachmentioning

confidence: 99%

A new approach for adaptive failure diagnostics based on emulation test

Ostendorff

Wuttke

Sachße

et al. 2010

2010 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE 2010)

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The paper describes a new approach of boundary scan emulation based testing for adaptive failure diagnostics using programmable logic. The motivation to speed up boundary scan based testing as well as the approach taken for this new concept and architecture are presented. With this approach the possibilities of boundary scan testing can be extended by using the available on-board resources for a faster and more real-time oriented test. The new options and benefits, as well as the necessary fundamentals of this approach are indicated. An example and first test results are given as well, to indicate the advantage of the proposed system. Keywords: adaptive systems; automatic test equipment; boundary scan testing; field programmable gate arraysI.

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“…Moreover, reconfigurable hardware, such as Field Programmable Gate Array (FPGA) or Complex Programmable Logic Devices (CPLD), can be used to support both normal functionality as well as testing 8 . During normal operation these devices can implement the desired functionality of the system while during testing they can be configured to support specific test requirements.…”

Section: Built-in Self Test (Bist)mentioning

confidence: 99%

Developing and Implementing Digital Systems Testing Course for Engineering and Technology Curriculum

Hasan¹

2011 ASEE Annual Conference &Amp; Exposition Proceedings

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(The Netherlands) under a Philips postgraduate scholarship program. He subsequently held several faculty positions in an engineering college and in a university in Malaysia. He obtained the Ph.D. in Computer Engineering from New Jersey Institute of Technology. He was awarded the NJIT Hashimoto Fellowship in the academic year 2005-06. He is currently an Assistant Professor of Engineering Technology and Industrial Distribution at TAMU. His research interests include the design, implementation, and testing of dynamically reconfigurable computing systems, performance evaluation of computer architectures, and behavioral synthesis and testing of digital systems, energy efficient embedded systems.

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Fast extended test access via JTAG and FPGAs

Cited by 14 publications

References 5 publications

FPGA-based universal embedded digital instrument

FPGA-based universal embedded digital instrument

A new approach for adaptive failure diagnostics based on emulation test

Developing and Implementing Digital Systems Testing Course for Engineering and Technology Curriculum

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