2021
DOI: 10.1016/j.microrel.2021.114240
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Fast cut-off, low I2T and high temperature monolithic on-chip fuse on silicon substrate for new fail-safe embedded power switch

Abstract: HAL is a multi-disciplinary open access archive for the deposit and dissemination of scientific research documents, whether they are published or not. The documents may come from teaching and research institutions in France or abroad, or from public or private research centers. L'archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la diffusion de documents scientifiques de niveau recherche, publiés ou non, émanant des établissements d'enseignement et de recherche français ou étrangers, des labor… Show more

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Cited by 1 publication
(5 citation statements)
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“…The required normalized energy to evaporate the fuse constrictions is defined by the I 2 T ([A 2 .s)]) parameter. From Table 2, we can notice that the fuses I 2 Tp parameter are very low and the difference between the theoretical and experimental values is very acceptable and some assumptions explaining the origin of this difference are explained in a previous work [7]. The pre-arcing times (Tp) are very short, making the fuses very fast in case of a short circuit occurrence.…”
Section: Fuse Characteristics and Designmentioning
confidence: 83%
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“…The required normalized energy to evaporate the fuse constrictions is defined by the I 2 T ([A 2 .s)]) parameter. From Table 2, we can notice that the fuses I 2 Tp parameter are very low and the difference between the theoretical and experimental values is very acceptable and some assumptions explaining the origin of this difference are explained in a previous work [7]. The pre-arcing times (Tp) are very short, making the fuses very fast in case of a short circuit occurrence.…”
Section: Fuse Characteristics and Designmentioning
confidence: 83%
“…The "Stand-alone" fuses [7] (Fig. 2) are made of a thin layer of copper (18 µm) to form the fuses constrictions and pads, electrodeposited on an insulated silicon wafer (500 µm), using a thin nitride (200 nm) layer to prevent leakage currents once the constrictions are evaporated.…”
Section: Fuse Characteristics and Designmentioning
confidence: 99%
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