2013
DOI: 10.1063/1.4789545
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Fast and low-temperature reduction of graphene oxide films using ammonia plasma

Abstract: A Raman spectroscopic investigation of graphite oxide derived graphene AIP Advances 2, 032183 (2012) Reduced graphene oxide (rGO) has been produced using an ammonia (NH 3 ) plasma reduction method. Simultaneous nitrogen doping during the reduction process enabled a rapid and low-temperature restoration of the electrical properties of the rGO. The chemical, structural, and electrical properties of the rGO films were analyzed using x-ray photoelectron spectroscopy, Raman spectroscopy, atomic force microscopy, an… Show more

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Cited by 37 publications
(23 citation statements)
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“…The authors explain the decrease in the I D /I G ratio by the formation of an intermediate chemical species, such as hydrazine radicals. The increase can be attributed to the restoration of the sp 2 bonds in the GO sheets due to the NH 3 plasma, which is consistent with the XPS results [39]. Studies of surface morphology, carried out in the same work, are consistent with these results.…”
Section: Nitrogen and Ammonia Plasmasupporting
confidence: 88%
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“…The authors explain the decrease in the I D /I G ratio by the formation of an intermediate chemical species, such as hydrazine radicals. The increase can be attributed to the restoration of the sp 2 bonds in the GO sheets due to the NH 3 plasma, which is consistent with the XPS results [39]. Studies of surface morphology, carried out in the same work, are consistent with these results.…”
Section: Nitrogen and Ammonia Plasmasupporting
confidence: 88%
“…The same results were received in Refs. [39,40]. In the work of other authors [32], the concentration of pyridinic-N (48%) was found to be higher than the Pyrrolic-N (29%) and Graphitic-N (15%).…”
Section: Nitrogen and Ammonia Plasmamentioning
confidence: 82%
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“…Finally, NH 3 plasma treatment was performed to further dope N into S‐CC, yielding N, S codoped porous CC (N, S‐CC). It is noted that NH 3 plasma could not only realize effective N doping and remove residual oxygen‐containing groups for improved electron transfer, but also etch the CC surface to engender more defect sites (Figure S3, Supporting Information), as also demonstrated in previous work . As a control, N‐doped porous CC (N‐CC) and S‐doped porous CC (S‐CC) were also prepared following similar procedures (Figure S4, see details in the Supporting Information).…”
mentioning
confidence: 63%