Far-Infrared Sources

Genzel, L.

doi:10.1007/978-1-4684-1863-7_4

Far-Infrared Properties of Solids 1970

DOI: 10.1007/978-1-4684-1863-7_4

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Far-Infrared Sources

L. Genzel

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1996

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An apparatus for infrared transmittance and reflectance measurements at cryogenic temperatures

et al. 1996

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A facility for measuring the optical properties of solid materials at cryogenic temperatures is being developed at the National Institute of Standards and Technology. A cryostat that houses four bolometric detectors and a six-position sample holder was designed and built. The bolometers operate near 5 K, and the sample temperature can be varied from 6 to 100 K. The beam from a Fourier transform spectrometer is directed to the cryostat by reflective optical components. The measurable wavelengths extend from 1 itm to 1 mm, with appropriate sources and beamsplitters in the spectrometer as well as windows and detectors in the cryostat. The angle of incidence on the sample ranges from 7.5 to 60 ° . The mechanical, electrical, and optical designs are described in this paper. Initial measurement results at wavelengths from 2 to 30 #m and a sample temperature of 10 K are presented.

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An apparatus for infrared transmittance and reflectance measurements at cryogenic temperatures

et al. 1996

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Far-Infrared Sources

Cited by 1 publication

References 91 publications

An apparatus for infrared transmittance and reflectance measurements at cryogenic temperatures

An apparatus for infrared transmittance and reflectance measurements at cryogenic temperatures

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