1969
DOI: 10.1364/ao.8.001667
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Far Infrared Measurement of the Dielectric Properties of GaAs and CdTe at 300 K and 8 K

Abstract: The real refractive index n and power absorption coefficient alpha of high resistivity GaAs and CdTe have been directly measured at 300 K and 8 K in the wavelength region from 12.5 micro to 300 micro. This spectral region contains the fundamental lattice resonance of both materials: 37.2 micro for GaAs and 71.4 micro for CdTe. This resonance causes large dispersion in the linear material properties. Single Drude-type oscillators have been visually fit to the measured n data with the results that for GaAs, epsi… Show more

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Cited by 112 publications
(31 citation statements)
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“…We can see that, as ν is varied for the magnetic field increased from 4.3 T to 5.4 T, the observed Faraday rotation angle significantly deviates from the Drude behavior, and approaches to the quantum one. Specifically, the observed Faraday rotation angle in the low-frequency edge of 2 meV takes a nearly constant value of −6.3 mrad in the magnetic-field range between 5.2 T and 5.6 T, in accordance with the value of −4α/(1 + n sub ) = −6.3 mrad with n sub = 3.6 for the GaAs substrate [30].…”
supporting
confidence: 73%
“…We can see that, as ν is varied for the magnetic field increased from 4.3 T to 5.4 T, the observed Faraday rotation angle significantly deviates from the Drude behavior, and approaches to the quantum one. Specifically, the observed Faraday rotation angle in the low-frequency edge of 2 meV takes a nearly constant value of −6.3 mrad in the magnetic-field range between 5.2 T and 5.6 T, in accordance with the value of −4α/(1 + n sub ) = −6.3 mrad with n sub = 3.6 for the GaAs substrate [30].…”
supporting
confidence: 73%
“…Actually, the extent of the tetrahedron deformation depends on the type of the defect. The influence of intrinsic and impurity defects on the phonon and vibrational spectra of CdTe and other semiconducting and dielectric compounds have been investigated in the past [7][8][9][10][11][12][13][14][15][16]. Also the vibrational modes induced by H atoms in Si [17,18], ZnSe [19] and GaAs [20,21] as well as the detection of hydrogen-impurity complexes in III-V materials via MIR spectrum analysis have been previously described [9].…”
Section: Introductionmentioning
confidence: 99%
“…2 has a bandwidth of 135 THz, from 2 to 20 μm, and is limited by the transmission of the material [14]. The spectrum contains a feature related to the 8.55 THz Raman shift in GaAs [15], which results in a Stokes peak near 16 μm.…”
mentioning
confidence: 99%