Failure pattern determination for integrated circuit devices using wet-chemical decapsulation and statistical reliability modelling

An information‐based burn‐in procedure for minimally repaired items from mixed population

“…Accordingly, the nonhomogeneous Poisson process (i.e., the minimal repair model) can be applied to describe the failure process. Furthermore, in practice, the distributions of the time to first failure of such system are frequently Weibull or other non‐exponential distributions (e.g., –). These imply that the failure process is not necessarily homogeneous Poisson process, and the nonhomogeneous Poisson process is more appropriate in such cases. Illustration 2 Frequently, some intrinsic faults in an electronic item (e.g., in the circuit boards in Illustration 1) may not cause physical failures of the components on the item, but can cause a sudden electric surge and sudden excessive electric current spikes, just resulting in the malfunctions of the item.…”

“…Accordingly, the nonhomogeneous Poisson process (i.e., the minimal repair model) can be applied to describe the failure process. Furthermore, in practice, the distributions of the time to first failure of such system are frequently Weibull or other non‐exponential distributions (e.g., –). These imply that the failure process is not necessarily homogeneous Poisson process, and the nonhomogeneous Poisson process is more appropriate in such cases.…”