2007
DOI: 10.1109/tepm.2006.890643
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Failure Morphology After Drop Impact Test of Ball Grid Array (BGA) Package With Lead-Free Sn–3.8Ag–0.7Cu and Eutectic SnPb Solders

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Cited by 28 publications
(9 citation statements)
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“…10e were coarser after 1000 h of thermal aging. However, since the fracture path of the as-soldered specimens was located in the bulk solder, as reported in the literature, 20,21 this demonstrates that the morphology predominantly presented a ductile fracture mode without the occurrence of IMCs at the root of the dimples, as shown in Fig. 10g.…”
Section: Observation Of Impact-induced Fracture Surfacesupporting
confidence: 70%
“…10e were coarser after 1000 h of thermal aging. However, since the fracture path of the as-soldered specimens was located in the bulk solder, as reported in the literature, 20,21 this demonstrates that the morphology predominantly presented a ductile fracture mode without the occurrence of IMCs at the root of the dimples, as shown in Fig. 10g.…”
Section: Observation Of Impact-induced Fracture Surfacesupporting
confidence: 70%
“…Failure of solder due to drop and impact of the components has emerged to be an important issue to the industry in recent years (see, e.g., [1][2][3][4][5][6][7][8][9][10][11][12][13]). This is different from the traditional thermomechanical fatigue problem, since the loading rate involved in drop and impact can be several orders of magnitude higher than that during thermal cycling.…”
Section: Introductionmentioning
confidence: 99%
“…Rather, it is the flexural bending of the circuit board that forces the solder to undergo large deformation [7,10,12,13]. Thus, depending on the geometry and material of the test vehicle, detailed test condition or real-life drop scenario, and the location of the particular joint of interest, solder joints can experience shear, compression, tension and their combination during the dynamic loading history.…”
Section: Introductionmentioning
confidence: 99%
“…The rapid increase in the number of miniaturized consumer electronics which can be easily dropped by the user has resulted in significant interest in the impact response of such interconnects. [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15] Impact reliability tests carried out by dropping the device, either once or a specific number of times, from a chosen height provide a simple means of quantitative joint system evaluation. 16 However, such studies do not provide sufficient information to select solder materials and/or joint geometries for improving the impact reliability of solder interconnects.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, in some recent studies, impact loading was carried out at the board level, with several joints present in a ball grid array simultaneously subjected to a single impact. [10][11][12][13][14][15] However, under such conditions the true impact loading experienced by any individual solder joint is difficult to access and quantify. Another important consideration is that these drop tests and board-level impact studies are conducted on asmanufactured parts, where results are more applicable to providing the impact reliability in handling and shipping of electronic components.…”
Section: Introductionmentioning
confidence: 99%