Failure mechanism of GTO devices and optimization for minimum current crowding during turn-off

Liang, Yung C.; Kee, T. K.

doi:10.1080/00207219408926107

Cited by 1 publication

(1 citation statement)

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“…Building on the simulation work reported in [3] (BAMBI) and [4] (TACTICS), the current project seeks to (1) include the impact of temperature on the device characteristics; (2) use multiple asymmetric unit cells; and (3) track thermal energy generation and storage within the device structure as a function of time.…”

Section: Introductionmentioning

confidence: 99%

The investigation of the electro-thermal characteristics of a GTO thyristor at turn off using SILVACO ATLAS

Ciezki

Vineyard

Weatherford

2009

2009 IEEE International Integrated Reliability Workshop Final Report

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MD 21402, ciezki@usna.edu, PH: (410) 293-6171, fax: (410) 293-3493 2-Naval Postgraduate School, Code EC/WT, Monterey, CA 93943, trweathe@nps.edu, PH: (831) 656-3044, fax: (831) 656-2760 I. ABSTRACTAn electro-thermal simulation model of a GTO thyristor operating in a pulse-power circuit is documented. The principle goal of this investigation was to examine an apparent current interruption derating advantage of the GTO at low frequency by tracking the generation, transfer, and dissipation of energy within the GTO structure and establishing a clear understanding of the localized heating phenomenon that results in ultimate device failure. Using a SPICE circuit model coupled with a SILVACO ATLAS TM physical model, a novel energy tracking methodology was used to confirm that the dominant mechanism for thermal energy generation was joule heating. The analysis further distinguished whether that location of joule heating was dominated by high current density or high electric field values. The results of this work suggest that it might be possible to predict the device lifetime by using this simulation approach to establish hot spot temperatures that form during turn off.

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Section: Introductionmentioning

confidence: 99%