2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) 2014
DOI: 10.1109/iirw.2014.7049522
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Failure mechanism analysis and process improvement on time-dependent dielectric breakdown of Cu/ultra-low-k dielectric based on complementary Raman and FTIR spectroscopy study

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Cited by 2 publications
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“…The specific structure and morphology of the developed Fe 3 O 4 -Au magnetic nanocomposites were studied by TEM and SEM. In particular, TEM measurement is an effective methodology for structure research in materials science and materials engineering [ 59 , 60 , 61 , 62 , 63 , 64 , 65 , 66 , 67 , 68 , 69 , 70 , 71 ]. Figure 3 displays SEM and TEM images of pure Fe 3 O 4 hollow microspheres.…”
Section: Resultsmentioning
confidence: 99%
“…The specific structure and morphology of the developed Fe 3 O 4 -Au magnetic nanocomposites were studied by TEM and SEM. In particular, TEM measurement is an effective methodology for structure research in materials science and materials engineering [ 59 , 60 , 61 , 62 , 63 , 64 , 65 , 66 , 67 , 68 , 69 , 70 , 71 ]. Figure 3 displays SEM and TEM images of pure Fe 3 O 4 hollow microspheres.…”
Section: Resultsmentioning
confidence: 99%
“…The morphology and detailed structure of the samples were investigated by SEM and TEM. In particular, the TEM technique is a direct and important methodology for structure analysis in the materials engineering technologies [ 49 , 50 , 51 , 52 , 53 , 54 , 55 , 56 , 57 , 58 , 59 , 60 , 61 ]. Figure 4 shows typical low-magnification TEM images of pure FePt nanocrystals, pure silver colloids, and FePt–Ag 5 mg–60 mL and FePt–Ag 10 mg–60 mL nanocomposites.…”
Section: Resultsmentioning
confidence: 99%