Failure analysis requirements for nanoelectronics

Vallett, D.P.

doi:10.1109/tnano.2002.806826

Cited by 23 publications

(15 citation statements)

References 17 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Even if this probability is high, the overall probability of reverse engineering the circuit can still be made negligible by inserting a large number of SBs. 80 ) is too many to exhaustively test in order to reverse-engineer the functionality. 2.…”

Section: A Resilience To Reverse-engineering and Sophisticated Attacksmentioning

confidence: 99%

TPAD: Hardware Trojan Prevention and Detection for Trusted Integrated Circuits

Ganesan

et al. 2016

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

View full text Add to dashboard Cite

Abstract-There are increasing concerns about possible malicious modifications of integrated circuits (ICs) used in critical applications. Such attacks are often referred to as hardware Trojans. While many techniques focus on hardware Trojan detection during IC testing, it is still possible for attacks to go undetected. Using a combination of new design techniques and new memory technologies, we present a new approach that detects a wide variety of hardware Trojans during IC testing and also during system operation in the field. Our approach can also prevent a wide variety of attacks during synthesis, place-and-route, and fabrication of ICs. It can be applied to any digital system, and can be tuned for both traditional and split-manufacturing methods. We demonstrate its applicability for both ASICs and FPGAs. Using fabricated test chips with Trojan emulation capabilities and also using simulations, we demonstrate: 1. The area and power costs of our approach can range between 7.4-165% and 0.07-60%, respectively, depending on the design and the attacks targeted; 2. The speed impact can be minimal (close to 0%); 3. Our approach can detect 99.998% of Trojans (emulated using test chips) that do not require detailed knowledge of the design being attacked; 4. Our approach can prevent 99.98% of specific attacks (simulated) that utilize detailed knowledge of the design being attacked (e.g., through reverse-engineering). 5. Our approach never produces any false positives, i.e., it does not report attacks when the IC operates correctly. I. INTRODUCTION HERE is growing concern about the trustworthiness of integrated circuits (ICs). If an untrusted party fabricates an IC, there is potential for an adversary to insert a malicious hardware Trojan [1], an unauthorized modification of the IC resulting in incorrect functionality and/or sensitive data being exposed [2]. These include (but are not limited to) [3]: a) Modification of functional behavior through logic changes: Index TermsFor example, extra logic gates may be inserted to force an incorrect logic value on a wire at some (arbitrary) point in time (Fig. 1a) [2]. b) Electrical modification: For example, extra capacitive loading may be placed on a circuit path to alter timing characteristics of the IC (Fig. 1b) [2]. c) Reliability degradation: For example, aging of transistors (e.g., Negative Bias Temperature Instability (NBTI)) may be accelerated, degrading reliability ( Fig. 1c) [4]. A hardware Trojan is detected when we report malicious modifications to an IC. A hardware Trojan is prevented when Manuscript received January 9, 2015; revised May 8, 2015; accepted July 20, 2015. Work supported by IARPA Trusted Integrated Chips (TIC) Program. All authors are with Dept. of Electrical Engineering, Stanford University, Stanford, CA 94305 USA (e-mail: tonyfwu@stanford.edu). S. Mitra is also with Dept. of Computer Science, Stanford University.we stop a hardware Trojan from being inserted. Part of the challenge in detecting or preventing hardware Trojans arises from the fact that...

show abstract

Section: A Resilience To Reverse-engineering and Sophisticated Attacksmentioning

confidence: 99%

TPAD: Hardware Trojan Prevention and Detection for Trusted Integrated Circuits

Ganesan

et al. 2016

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

View full text Add to dashboard Cite

show abstract

“…An established reliability analysis tool, FMMEA (Failure Modes, Mechanisms, and Effects Analysis) provides a systematic and structured study of potential failures that might occur in any part of a system; it can be used to determine their potential effects on system reliability to improve the design, manufacturing process and operation [13]. This analysis is proactive since problems can be investigated before completion of design, preventing in-service failures.…”

Section: Fmmea Approach To Characterize Letma's Failure Mechanismsmentioning

confidence: 99%

“…Fatigue lifetime is computed according to Eq. (13). Reliable strain changes in the Coffin-Manson rule can be obtained from multiple thermal cycles calculations since the metal layers undergo complex plastic deformation.…”

Section: Analysis Of Thermal Fatiguementioning

confidence: 99%

“…In order to assess the reliability under desired environmental and operational conditions, comprehensive humidity and temperature reliability tests were also implemented in [11]. And literatures [1,12,13] explained some typical failure mechanisms (such as friction, wear and fatigue), and their testing methods. Such experimental approaches resulted in some common disadvantages, including increased cost, required time and effort.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Multiphysics modeling approach for micro electro–thermo–mechanical actuator: Failure mechanisms coupled analysis

Wang

Zeng

Silberschmidt

et al. 2015

Microelectronics Reliability

View full text Add to dashboard Cite

“…We have tried to analyze the Reliability [3] and reported the Failure Analysis, Failure Mechanisms, and Failure Modes [4] of Functional Carbon Nanotube based devices based on the chemical reactivity of functionalized CNTs. Result show that CNTs when used in sensors [5] will be in contact with the environment and hence we have concluded that though reliability [6] and failure depends on the functional part of CNT but we can create categories and subdivisions thereby making study and problemsolving easy.…”

mentioning

confidence: 99%

Reliability analysis of functional CNT

Shivhare¹,

Joshi²,

Ahmed³

2009

Chemistry Central Journal

View full text Add to dashboard Cite

Due to extraordinary mechanical electrical and optical properties CNTs have attracted a great deal of attention. In order to transfer their outstanding properties from nano to micro scale one essential step involved is CNT functionalization. We have studied the various functionalized Carbon Nano tube like the fluorinated CNTs, CNT amines [5] will be in contact with the environment and hence we have concluded that though reliability [6] and failure depends on the functional part of CNT but we can create categories and subdivisions thereby making study and problemsolving easy. We have reported the failure-free time for the functionalized CNTs, which is a probabilistic variable and varies with the change in the functional group associated with the CNT which is based on the chemical reactivity of various functional CNTs. We have computed these probabilities for a sufficiently pure sample of the particular functionalized CNT. The probabilities are MTBF (Mean Time between Failures) and MTTF (Mean Time to Failure) for the specific functionalized CNT.We have done modeling and computation on MATLAB and made a small library cntfrel, which provides user to work on some of the functionalized CNT and study their properties like reactivity at different environments and calculate some aspects of reliability like Failure Modes, Failure Mechanisms, and Failure Analysis. Result show that we can predict the phenomenon using tools like MATLAB, which can accelerate the research in calculating reliability of Functional CNT based devices.

show abstract

Failure analysis requirements for nanoelectronics

Cited by 23 publications

References 17 publications

TPAD: Hardware Trojan Prevention and Detection for Trusted Integrated Circuits

TPAD: Hardware Trojan Prevention and Detection for Trusted Integrated Circuits

Multiphysics modeling approach for micro electro–thermo–mechanical actuator: Failure mechanisms coupled analysis

Reliability analysis of functional CNT

Contact Info

Product

Resources

About