2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) 2008
DOI: 10.1109/iemt.2008.5507872
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Failure analysis for Copper Wire Bonding process from machine perspective

Abstract: In fast changing and very competitive industry like semiconductor manufacturing. reliability or probability of failure always has been a crucial part in any processes and operation involving machine and equipment. One of many electronic manufacturing tecImologies is Wire Bond process, which entails a flexible and an accurate tecImology because of fast changing market demand for smaller electronic gadgets. Nature of wire bond process which is very delicate, usually makes any failures happen during tins type of … Show more

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