Fail-safe switching-cells architectures based on monolithic on-chip fuse

Abstract

In this work, we propose a new concept of fail-safe switching cells based on the use of integrated fuses. These fuses allow the circuit to be partially isolated and reconfigured, which therefore becomes fault tolerant and prevents total shut down. We focused our work on the design and 3D simulation by finite elements method of monolithic fuses integrated on silicon substrate, taking into account static and dynamic specifications. Thermal management in steady state is improved by dielectric epoxy thermal insulation under each constriction of the fuse. Implementation and preliminary practical tests at medium voltage are reported. The effect of a coating using silicone gel around the fuses is analyzed to improve the cutoff capability.

Fuse on PiN Silicon Diode Monolithic Integration for New Fail-Safe Power Converters Topologies

“…The pre-arcing times (Tp) are very short, making the fuses very fast in case of a short circuit occurrence. It has also been shown in [8] a reduction in the area of the fuse by a ration ratio of about five, and therefore in its compactness, as compared to the best commercially available SMD fuses.…”

“…2 Finite elements simulations using Comsol™ were carried out and experimental results allowed to validate the on-state operation of the components. Fast cut-off fuses with very low pre-arcing times (4 to 6 µs) under 200 VDC bus voltage have been reported, with low leakage currents ensuring high post-arc isolating resistance (up to 8 MΩ) [7], [8]. Then, the fuses were integrated on silicon PiN diodes (Fig.…”

“…The clean room process based on electrolytic growth of copper, provides micrometer resolution, which is better than classical fuses, resulting in less dispersive I 2 T values. In a previous work [8], the phase-leg dual-fuse function has been investigated in order to study the "Stand-alone" fuses symmetrical operation during a short-circuit. The characterization results showed well balanced post-arc voltages distribution between low-side and high-side fuses.…”