Abstract:The fading of radiation-sensitive p-channel metal-oxide-semiconductor field-effect transistors (known as RADFETs or pMOS dosimeters) over a long time period of 10 years after irradiation has been investigated. Fading is, in addition to sensitivity, another characteristic of pMOS radiation dosimeters. It is considered as the recovery of threshold voltage of irradiated pMOS dosimeters during ambient annealing without gate polarization. Usually, there are the fading data for few months after irradiation only. Alt… Show more
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