“…The XRD pattern with reflection peaks is associated with planes (111), (220), (311), (400), (422), (511), and (440) at 2θ = 20.0°, 31.27°, 38.62°, 44.81°, 55.75°, 59.45°, and 65.38°, respec-tively, and plan 〈311〉 is observed as the preferred orientation as reported in other studies present in literature. [38,39] As an interpretation of the prevailing etching and synthesis procedure, the XRD patterns of MXene present tremendously inadequate or negligible peaks. The black line that is displayed in Figure 2 highlights the XRD spectra of MXene that illustrate the microwave-assisted rapid etching of Al from the MAX phase, followed by the development of delaminated MXene sheets.…”