Facile synthesis and characterization of ZnO, ZnO:Co, and ZnO/ZnO:Co nano rod-like homojunction thin films: Role of crystallite/grain size and microstrain in photocatalytic performance

Template-free chemical deposition of highly crystalline ZnO nanorod thin films

“…These values of microstrain and dislocation density compare well with reported values in the literature for ZnO nanorod films using the dip coating method. 30 In comparison with another recently published article on ZnO nanorod films using the sol-gel method 20 for which the microstrain was estimated to be on the order of 10 À1 , our films reported here show three orders of magnitude lower microstrain (Table 1). The measured thickness of the films ranges from 300 nm to about 1000 nm, beyond which the films did not exhibit good adhesion to substrates.…”

Proton Ion Irradiation on As40Se50Sb10 Thin Films: Fluence-Dependent Tuning of Linear–Nonlinear Optical Properties for Photonic Applications

“…Instead, it showed three broad humps, which are the signals from the glass substrate that confirm their amorphous nature. There are several studies which have reported a similar kind of XRD pattern in As–Sb–Se-based thin films. , Although it would have been a great advantage for the structural analysis to evaluate the crystallite size, microstrain, lattice parameters, dislocation density, and so forth, but due to the absence of any sharp crystalline peaks, the discussion on the optical properties and parameters such as the lattice mismatch and the thermal extinction coefficient is not possible for the as-prepared and proton-irradiated thin films . The retention of amorphous nature even after increasing the proton irradiation fluence might be related to the increase in defect states of the material.…”

CsPbBr3 microarrays with tunable periodicity, optoelectronic and field emission properties using self-assembled polystyrene template and co-evaporation method

“…The average grain size of compact CsPbBr 3 films and microarrays can be estimated by Debye-Scherrer equation (D hkl = 0.9l/bcos y) in which the (220) diffraction peak with the strongest intensity has been used. [45][46][47] All XRD spectra are normalized to the (220) diffraction peak. As shown in Fig.…”