1980
DOI: 10.1147/rd.242.0195
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Fabrication Process for Josephson Integrated Circuits

Abstract: A process for fabricating experimental Josephson integrated circuits is described that is based primarily on the use of vacuum-deposited Pb-alloy and SiO films patterned by photoresist stencil lift-off. The process has evolved from one previously reported, with changes having occurred injunction electrodes, tunnel barrier formation, layer patterning, device geometry, and minimum linewidths. Films of Pb-In{l2 wt%)-Au(4 wt%) alloy (200-800 nm thick) are used for forming junction base electrodes, interferometer c… Show more

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Cited by 195 publications
(8 citation statements)
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“…Experiments to observe quantum corrections to the noise in resistively shunted junctions have been carried out by Koch et al (198la, 1982 (Greiner et al, 1980). The configuration is shown in Fig.…”
Section: B Experimentsmentioning
confidence: 99%
“…Experiments to observe quantum corrections to the noise in resistively shunted junctions have been carried out by Koch et al (198la, 1982 (Greiner et al, 1980). The configuration is shown in Fig.…”
Section: B Experimentsmentioning
confidence: 99%
“…Tests were made both on wafers coated with SiO and with Pb-In-Au alloy [13] (Mj layer) films, the types of surfaces found in Josephson circuits. The wafers were exposed with an electron dose of 1.5 x lO"* C/cm at 15 keV (2.4 x 10""" J) in a Vectorscan [22] exposure machine.…”
Section: Resists Investigatedmentioning
confidence: 99%
“…The chlorobenzene soak reduces the development rate near the resist surface and provides a reproducible undercut under a wide range of processing conditions. This approach has been used to develop a process for fabricating Josephson integrated circuits [13], We have attempted to improve the resolution of the process by substituting electron exposure for optical exposure. Our experience with ®AZ-1350J makes the use of the same resist for e-beam exposure very attractive, since this material is known to be suitable for all steps in the Josephson process.…”
Section: *Az-i350j With Chlorohenzene Soakmentioning
confidence: 99%
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“…Thus, we introduced a simple device structure, such as a Pb-alloy-based Josephson tunneling junction, 16) into YBCO/ PrBa 2 Cu 3 O 7Àx (PBCO)/YBCO trilayer junctions. In this device structure, the YBCO layer as a counter electrode serves as a wiring layer.…”
mentioning
confidence: 99%