2000
DOI: 10.1016/s0022-0248(99)00824-6
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Fabrication of submicrometer structures by PSE/MBE

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Cited by 11 publications
(8 citation statements)
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“…We demonstrated selective area epitaxy of GaAs using a patterned graphene mask on Ge (001), over a length scale of 10 microns. The selectivity is comparable to previous demonstrations of selective area epitaxy by MBE using SiO 2 masks, where smaller spacings of a 100 nm to 2 microns are more typical [9,20,21]. The main limiting feature in the current work is the rough surface morphology of GaAs on Ge (001), which we attribute to graphene-induced faceting of the Ge (001) surface.…”
Section: Discussionsupporting
confidence: 82%
“…We demonstrated selective area epitaxy of GaAs using a patterned graphene mask on Ge (001), over a length scale of 10 microns. The selectivity is comparable to previous demonstrations of selective area epitaxy by MBE using SiO 2 masks, where smaller spacings of a 100 nm to 2 microns are more typical [9,20,21]. The main limiting feature in the current work is the rough surface morphology of GaAs on Ge (001), which we attribute to graphene-induced faceting of the Ge (001) surface.…”
Section: Discussionsupporting
confidence: 82%
“…The growth method of MCE/MBE, in which the molecular beams use shallow angles, is called low-angle incident microchannel epitaxy (LAIMCE) [89][90][91]. The experimental arrangements for LAIMCE are given in Figure 23.40(a), where the line seed orientation (g), Ga, and As 4 beam angles with respect to line seed (a) and substrate surface (b) are defined.…”
Section: Enhancement Of Lateral Growth By Intersurface Diffusionmentioning
confidence: 99%
“…Low angle incidence microchannel epitaxy (LAIMCE) is considered to be an excellent growth method to solve the former problem [16]. Fig.…”
Section: Introductionmentioning
confidence: 99%