2012
DOI: 10.1016/j.jelechem.2011.12.005
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Fabrication of soft gold microelectrode arrays as probes for scanning electrochemical microscopy

Abstract: a b s t r a c tSoft linear gold microelectrode arrays for high throughput scanning electrochemical microscopy (SECM) imaging were fabricated using the Aerosol Jet Ò printing technology. Nanoparticulate gold ink was printed on polyimide Kapton HN Ò thin films. After sintering, a 200 nm thick Parylene C coating was deposited to cover and seal the gold tracks. A cross-section of the array of microelectrodes was exposed by laser cutting using an ArF excimer laser beam directed onto a metallic mask. Cyclic voltammo… Show more

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Cited by 46 publications
(47 citation statements)
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“…[29] The pressure exerted by the probe on the sample is in the range of 10 3 N m À2 . [32] Although this value is not very precise because of difficulties in estimating the contact area between the probe and the substrate, it is around four orders of magnitude smaller than the pressure in standard SFM experiments. [33] Therefore, it should be possible to image delicate samples.…”
mentioning
confidence: 99%
“…[29] The pressure exerted by the probe on the sample is in the range of 10 3 N m À2 . [32] Although this value is not very precise because of difficulties in estimating the contact area between the probe and the substrate, it is around four orders of magnitude smaller than the pressure in standard SFM experiments. [33] Therefore, it should be possible to image delicate samples.…”
mentioning
confidence: 99%
“…Herein, the probe-sample contact is represented by the previously described quantity h P [49][50][51]53]. In short, if the probe is placed in solution bulk h P describes the vertical distance of the probe apex to the sample surface.…”
Section: Secm Measurementsmentioning
confidence: 99%
“…Recently, we have introduced soft carbon and gold microelectrode probes that are made in thin polymeric materials providing flexibility and mechanical stability to SECM imaging [49,50]. These probes are scanned in contact mode over surfaces in a brushinglike way achieving an almost constant d. This enables scanning of 3D patterns [51], slightly tilted [51] or even vertically orientated substrates [52] without additional instrumentation for distance control.…”
Section: Introductionmentioning
confidence: 99%
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