2015
DOI: 10.1016/j.apsusc.2014.12.003
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Fabrication of patterned flexible graphene devices via facile direct transfer of as-grown bi-layer graphene

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Cited by 9 publications
(3 citation statements)
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“…From an experimental point of view, the control of graphene properties for different applications and for the integration of the materials in the devices often requires the patterning of the material so that it conforms to specific dimensions and geometries [6]. This is the case of the preparation of transistors [7] [8] or transparent electrodes [9] [10].…”
Section: Introductionmentioning
confidence: 99%
“…From an experimental point of view, the control of graphene properties for different applications and for the integration of the materials in the devices often requires the patterning of the material so that it conforms to specific dimensions and geometries [6]. This is the case of the preparation of transistors [7] [8] or transparent electrodes [9] [10].…”
Section: Introductionmentioning
confidence: 99%
“…So far, several methods have been developed for patterning graphene into desired structures, including photolithography [14], electron beam lithography [15], plasma etching [16], laser direct patterning [17][18][19] and catalytic hydrogenation [20]. However, these patterning methods have inherent limitations like multiple processing steps, low throughput, requiring harsh conditions or suffering from photoresist contamination of the graphene surface etc, restricting the development of graphene electronics.…”
Section: Introductionmentioning
confidence: 99%
“…Recently there have been several attempts to develop direct patterning methods, which can minimize or eliminate the problems inherent to conventional patterning. 9,10) Here, we utilized the atomic force microscopy (AFM)-based lithography technique, oxidation scanning probe lithography (o-SPL), [11][12][13][14] that enables nanometer resolution patterns in the atmospheric environment and eliminates several fabrication steps required in the conventional lithography method.…”
mentioning
confidence: 99%