Fabrication of Focused Ion Beam-Deposited Nanowire Probes for Conductive Atomic Force Microscopy

Gacka, Ewelina; Pruchnik, Bartosz  C.; Tamulewicz-Szwajkowska, Magdalena; Badura, Dominik; Rangelow, Ivo; Gotszalk, Teodor  P.

doi:10.2139/ssrn.4697037

2024

DOI: 10.2139/ssrn.4697037

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Fabrication of Focused Ion Beam-Deposited Nanowire Probes for Conductive Atomic Force Microscopy

Ewelina Gacka,

Bartosz C. Pruchnik,

Magdalena Tamulewicz-Szwajkowska

et al.

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Fabrication of Focused Ion Beam-Deposited Nanowire Probes for Conductive Atomic Force Microscopy

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References 48 publications

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