Ferroelectrics - Applications 2011
DOI: 10.5772/16405
|View full text |Cite
|
Sign up to set email alerts
|

Fabrication and Study on One-Transistor-Capacitor Structure of Nonvolatile Random Access Memory TFT Devices Using Ferroelectric Gated Oxide Film

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2016
2016
2016
2016

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(2 citation statements)
references
References 31 publications
0
2
0
Order By: Relevance
“…They are applied for fabrication of high-value capacitors, components of various physical sensors, computer memory microchips (DRAM и FRAM) and high-frequency devices such as varistors, frequency multiplicators, filters, oscillators and resonators [1][2][3]. One of the most widely used ceramic ferroelectric materials is barium titanate (BaTiO 3 (BT)), which possesses the perovskite (ABO 3 ) crystal structure based on octahedrons (TiO 6 ) bonded with Ba cations [4][5][6].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…They are applied for fabrication of high-value capacitors, components of various physical sensors, computer memory microchips (DRAM и FRAM) and high-frequency devices such as varistors, frequency multiplicators, filters, oscillators and resonators [1][2][3]. One of the most widely used ceramic ferroelectric materials is barium titanate (BaTiO 3 (BT)), which possesses the perovskite (ABO 3 ) crystal structure based on octahedrons (TiO 6 ) bonded with Ba cations [4][5][6].…”
Section: Introductionmentioning
confidence: 99%
“…The aim of the work was to investigate how the parameters of SCS affect BT phase composition, microstructure and electro-physical properties of the product. 3 …”
Section: Introductionmentioning
confidence: 99%