2009
DOI: 10.1021/nl902872w
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Fabrication and Microstructure Control of Nanoscale Mechanical Testing Specimens via Electron Beam Lithography and Electroplating

Abstract: It has been demonstrated that the mechanical properties of materials change significantly when external dimensions are confined to the nanoscale. Currently, the dominant fabrication method for mechanical testing specimens with nanometer dimensions is by using focused ion beam (FIB) milling, which results in inevitable Ga(+) induced damage to the microstructure. Here, we report a FIB-less fabrication technique to create arrays of vertically oriented gold and copper nanopillars based on patterning polymethylmeth… Show more

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Cited by 119 publications
(85 citation statements)
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“…1 In this methodology, a thin layer of Au (~100 nm) is first evaporated onto a silicon wafer coated with a 30nm-thick Ti layer without breaking the vacuum. The ~700nm-thick PMMA is then spin-coated onto this seed layer, patterned using e-beam lithography, and developed to reveal vertical through-holes with the desired diameters.…”
Section: Synthesismentioning
confidence: 99%
See 1 more Smart Citation
“…1 In this methodology, a thin layer of Au (~100 nm) is first evaporated onto a silicon wafer coated with a 30nm-thick Ti layer without breaking the vacuum. The ~700nm-thick PMMA is then spin-coated onto this seed layer, patterned using e-beam lithography, and developed to reveal vertical through-holes with the desired diameters.…”
Section: Synthesismentioning
confidence: 99%
“…Table 2 provides details on the specific Ni-P electroplating conditions. More details about this fabrication method for other metallic nano structures can be found in 1 .…”
Section: Synthesismentioning
confidence: 99%
“…Samples were fabricated using electron beam lithography and electroplating to create arrays of vertically oriented nano-cylinders, following the methodology of Burek et al 1 . In this methodology, the nano-cylinder arrays were fabricated on 1 cm 2 Si substrates covered by a 20 nm thick Ti adhesion layer and a 100 nm thick Au seed layer deposited on the substrates by electron beam evaporation.…”
Section: Sample Fabricationmentioning
confidence: 99%
“…Therefore, in order to understand what drives the size effect, it is imperative to mechanically test pillars produced via FIB-less fabrication methods yet with nonzero dislocation densities. Recently, Burek et al developed a FIBless method to produce single-crystalline Cu nanopillars by electroplating Cu into an array of electron beam patterned holes in a Poly(methyl methacrylate) matrix [33]. Thin films of electroplated copper have been reported to contain trace amounts (.005% by weight) of carbon from the plating process [34].…”
mentioning
confidence: 99%