Abstract:Crystalline quasi‐2D Ti‐δ‐doped γ‐alumina (2D‐Ti:γ‐alumina) is synthesized by a facile, precursor‐alternating atomic‐layer‐deposition technique followed by a post‐growth air‐anneal at ≈800 °C. According to energy‐dispersive X‐ray spectroscopy maps, Ti atomic concentration remains uniform and approaches ≈1.5%. Subject to several UV‐light exposures, the samples are found to develop a full strength, stable emission in the ultrawide spectral range of ≈350–850 nm. The near‐infrared (NIR) emission band centered at ≈… Show more
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