Ba 0.5 Sr 0.5 TiO 3 ͑BST͒ films, 600 Å thick and 3 mol % Mn-doped, deposited on La 0.68 Ba 0.32 MnO 3 ͑LBMO͒-coated LaNiO 3 /Pt/Ti/SiO 2 /Si substrates exhibit elongation along the c-axis lattice. A suitable degree of lattice distortion of the BST films increases the dielectric constant. The nonlinear relationship between the dielectric constant and the applied bias voltage indicates that partially strained BST films on the LBMO buffer layers have ferroelectric properties. An LBMO buffer layer deposited at a higher growth temperature is comprised of larger grains, and therefore a rougher surface structure and increased leakage current of the deposited BST film. Ba x Sr 1−x TiO 3 has been extensively investigated as the chargestorage dielectric for use in dynamic random access memory and as an electric-field-tunable element for high-frequency devices. 1,2 Paraelectric Ba 0.5 Sr 0.5 TiO 3 ͑BST͒ in actual devices has many important properties: it is a good insulator with large relative dielectric permittivity and a small dielectric loss near the ambient temperature, as well as a low leakage current density. 3 Recently, considerable effort has been made to increase the dielectric constant and reduce the leakage current of BST thin-film capacitors. The most logical approaches involve varying the film composition and changing the processing conditions. 4,5 However, a common problem is that the dielectric constant of BST thin-film capacitors depends strongly on thickness. As the thickness of the dielectric thin film is reduced to tens of nanometers to meet the requirements of the device, the dielectric constant in the oxide film falls markedly. 6 Defects such as oxygen vacancies that are formed during the preparation of a BST thin film may worsen leakage and breakdown properties. 7 Pt has been extensively adopted as a bottom electrode in perovskite oxide capacitors, 8 and electrical degradation caused by the formation of hillocks at high temperature and the formation of an interfacial layer degrades the performance of capacitors. 9 These critical issues need to be resolved to realize BST films in device applications. Mn-doped BST films grown at an appropriately controlled temperature have satisfactory electrical properties for use in tunable devices. 10,11 The acceptor behavior of substitution of Mn at the Ti site in perovskite is the reduction of the number of conducting electrons in the material, improving the electrical characteristics, such as by reducing the leakage current of the material. In contrast, electromobility and the generation of ionized oxygen vacancies are promoted by acceptor doping, rapidly degrading the ceramic. Doping with donor elements reduces the number of ionized oxygen vacancies and their electromigration toward the cathode of the sample. Recently, conductive perovskite oxides have become attractive as electrode materials in BST capacitors because they have a similar crystalline structure and chemistry. [11][12][13] The perovskite electrodes provide a compatible interface for the dielectric ox...