Abstract:Thin films of zinc ferrite (ZnFe 2 O 4 ) were deposited on glass, quartz and p-silicon (100) substrates by the sol-gel method. The structural properties of the films were studied using x-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The XRD data show the film having a spinel structure and the crystalline phase exists after annealing at 500 o C for 2 h in air. The SEM and AFM images show the nano-crystalline nature of the films. The optical transmittance decreased … Show more
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