1991
DOI: 10.1007/bf01124655
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Fabrication and characterization of thin films with perpendicular magnetic anisotropy for high-density magnetic recording

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1991
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Cited by 10 publications
(1 citation statement)
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“…This work was followed by experiments carried out on ultrathin NiFe films grown on Cu(111) [2] which confirmed the interfacial nature of the perpendicular magnetic anisotropy (PMA) observed in this system. Within the last fifty years a lot of work has been carried out on interfacial anisotropy both from theoretical and experimental points of view [3][4][5][6][7][8]. Nowadays, perpendicular interfacial anisotropy has become one of the main ingredients of novel magnetic memory elements employing out-of-plane magnetized (perpendicular) magnetic tunnel junctions (pMTJ) stacks [9][10][11].…”
Section: Introductionmentioning
confidence: 99%
“…This work was followed by experiments carried out on ultrathin NiFe films grown on Cu(111) [2] which confirmed the interfacial nature of the perpendicular magnetic anisotropy (PMA) observed in this system. Within the last fifty years a lot of work has been carried out on interfacial anisotropy both from theoretical and experimental points of view [3][4][5][6][7][8]. Nowadays, perpendicular interfacial anisotropy has become one of the main ingredients of novel magnetic memory elements employing out-of-plane magnetized (perpendicular) magnetic tunnel junctions (pMTJ) stacks [9][10][11].…”
Section: Introductionmentioning
confidence: 99%