2022
DOI: 10.1016/j.matpr.2021.05.588
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Fabrication and characterization of a bulk micromachined polysilicon piezoresistive accelerometer

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Cited by 4 publications
(2 citation statements)
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“…This accelerometer can measure an ultra-low frequency (ULF) vibration. A polysilicon-based piezoresistive MEMS accelerometer has been developed in recent years [ 10 ]. It has a capability to detect different frequencies from 75 Hz to 475 Hz as sinusoidal signals.…”
Section: Introductionmentioning
confidence: 99%
“…This accelerometer can measure an ultra-low frequency (ULF) vibration. A polysilicon-based piezoresistive MEMS accelerometer has been developed in recent years [ 10 ]. It has a capability to detect different frequencies from 75 Hz to 475 Hz as sinusoidal signals.…”
Section: Introductionmentioning
confidence: 99%
“…However, relevant researches are only focused on the case of single defect. Moreover, as the MEMS (Micro-Electro-Mechanical System) highly developed into nano-scale, the group of surface pit defects is becoming a common practice in the bulk micromachining [ 16 , 17 , 18 , 19 ], especially in the dry etching field [ 20 , 21 ]. So it is in great significance to simulate the thin film with surface multi-defects; however, relevant investigations on this aspect are still rare to see.…”
Section: Introductionmentioning
confidence: 99%