2005
DOI: 10.1154/1.1968348
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F13 Fundamental Parameter Method Using Scattering X-rays in X-ray Fluorescence Analysis

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Cited by 4 publications
(4 citation statements)
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“…The secondary targets used for this study were Mo, Cu, Rx9, and Si. All samples for the sample preparation study were analysed with the FP [24,32,33]. Operationally the Rigaku EDXRF system allows the creation of 'alpha corrections' or matching libraries to correct FP-derived analytical results.…”
Section: Edxrf Analysismentioning
confidence: 99%
“…The secondary targets used for this study were Mo, Cu, Rx9, and Si. All samples for the sample preparation study were analysed with the FP [24,32,33]. Operationally the Rigaku EDXRF system allows the creation of 'alpha corrections' or matching libraries to correct FP-derived analytical results.…”
Section: Edxrf Analysismentioning
confidence: 99%
“…The Rigaku fundamental parameters software assumes that absorbance and enhancement effects can affect concentrations and provides a coefficient to correct for these matrix effects. 21,22 This function improved the correlation coefficients for all elements by correcting for the effects of K, Co, Ca, P, and Mo (Table III). Concentrations determined using empirical calibration are denoted by the term XRF_emp.…”
Section: Resultsmentioning
confidence: 99%
“…The study's secondary targets were Mo, Cu, Rx9, and Si. The fewer fundamental parameters technique (FP), a standard procedure, was used to analyze the samples (Omote et al, 1995;Kataoka et al, 2006). The Rigaku EDXRF system's operational features allow the development of "alpha corrections" or matching libraries to rectify FP-derived analytical data.…”
Section: Preparation and Laboratory Analysis Of Samplesmentioning
confidence: 99%