Extrinsic Surface Photovoltage Spectroscopy — An Alternative Approach To Deep Level Characterisation In Semiconductors

Germanova, K.; Hardalov, Ch.; Saraydarov, M.

doi:10.1007/978-94-010-0632-3_30

Photovoltaic and Photoactive Materials — Properties, Technology and Applications 2002

DOI: 10.1007/978-94-010-0632-3_30

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Extrinsic Surface Photovoltage Spectroscopy — An Alternative Approach To Deep Level Characterisation In Semiconductors

K. Germanova

Ch. Hardalov

M. Saraydarov

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Extrinsic Surface Photovoltage Spectroscopy — An Alternative Approach To Deep Level Characterisation In Semiconductors

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