Extraction of floating-gate capacitive parameters in split-gate flash memory cells

Tkachev, Yuri

doi:10.1109/icmts.2016.7476186

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Extraction of floating-gate capacitive parameters in split-gate flash memory cells

Cited by 6 publications

References 11 publications

The sources of erase voltage variability in split-gate flash memory cell arrays

The sources of erase voltage variability in split-gate flash memory cell arrays

Silicon dioxide degradation in strongly non-uniform electric field

A Detailed Analysis of Hot-Electron Programming Efficiency in 40-nm Split-Gate Flash Memory Cells

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