2009
DOI: 10.1109/ted.2008.2011930
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Extraction of Electron and Hole Ionization Coefficients From Metamorphically Grown InGaSb Diodes

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Cited by 9 publications
(8 citation statements)
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“…According to the calculation, for the present InGaSb PIN photodiodes the cutoff wavelength is 2271 nm which is close to the experimentally found cutoff wavelength 2270 + 5 nm [16]. So the developed model fits adequately well with the experimental results obtained for InGaSb PIN photodiodes.…”
Section: Responsivity Quantum Efficiency and Detectivitysupporting
confidence: 85%
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“…According to the calculation, for the present InGaSb PIN photodiodes the cutoff wavelength is 2271 nm which is close to the experimentally found cutoff wavelength 2270 + 5 nm [16]. So the developed model fits adequately well with the experimental results obtained for InGaSb PIN photodiodes.…”
Section: Responsivity Quantum Efficiency and Detectivitysupporting
confidence: 85%
“…The model is based on the calculation of the dislocation dependence of minority carrier lifetime and recombination velocity of the carriers at the dislocations. By fitting the model to the experimental data [9,10,16], we obtain the diffusion lengths of electrons and holes to be 70.34 and 6.44 mm, respectively. The surface recombination velocities at the interface and at the exposed mesa edges are observed to be 2.26 × 10 2 and 4.12 × 10 5 cm/s, respectively.…”
Section: Discussionmentioning
confidence: 99%
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“…There has been already a substantial amount of work done to extract ionization coefficients from various alloys of III-V ternary alloys [3]. The semi-analytical expression of Okuto and Crowell [4] bear significant results.…”
Section: Introductionmentioning
confidence: 99%
“…For further study, the effects on the spectral response due to the variation of temperature, dislocations, photon energy, diffusion depth, and carrier concentration can also be analyzed [6]. The electron and hole ionization coefficients for InGaSb PIN photodiodes [8] can also be modeled in a similar fashion. These models can be utilized to combine the aforementioned parameters appropriately and thus optimize the device performance.…”
mentioning
confidence: 99%