2012
DOI: 10.1016/j.nima.2012.06.011
|View full text |Cite
|
Sign up to set email alerts
|

Extraction of correlated count rates using various gate generation techniques: Part I theory

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
13
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
8

Relationship

2
6

Authors

Journals

citations
Cited by 29 publications
(13 citation statements)
references
References 4 publications
0
13
0
Order By: Relevance
“…In terms of the RTI number distribution we can write the second order multiplet rate as follows [7,8]:…”
Section: Optimum Gate Width Selection -Feynman-y (Rti) Analysismentioning
confidence: 99%
“…In terms of the RTI number distribution we can write the second order multiplet rate as follows [7,8]:…”
Section: Optimum Gate Width Selection -Feynman-y (Rti) Analysismentioning
confidence: 99%
“…Depending on the method used for the analysis, various combinations of gate generators, delay lines, shift register coincidence circuits and variable dead time circuits [6,7,9,10] are used to acquire the data in the experiment. Work related to gate width optimisation and gate generation technique was reported recently [11,12]. Thus the configuration of electronics modules for acquisition of data is specific to the theoretical method used for the data analysis.…”
Section: Introductionmentioning
confidence: 99%
“…The latter approach is typically employed to perform Feynman variance-to-mean analysis, however, the information contained in the random-gate multiplicity distribution generated using the long delay may also be used to extract correlated events as shown in [5]. A link between the Feynman variance-to-mean analysis and PNMC was recently established and discussed in detail in [5][6][7] and relies on the realization that multiplicity distribution constructed from series of random-gates can itself be utilized to extract the genuine correlated multiplicity rates. This approach was termed Randomly Triggered Interrogation (RTI).…”
Section: Introductionmentioning
confidence: 99%
“…Theoretical expressions for triggered-gate as well as randomgate GUF values are available [7,8] and generally rely on a single die-away time assumption, derived for an idealized detection system, where neutron population lifetime can be described by a single exponential. The corresponding expressions are written as follows:…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation