Extraction of circuit models for substrate cross-talk

Smedes, T.; Meijs, N.P. van der; Genderen, A.J. van

doi:10.1109/iccad.1995.480013

Cited by 75 publications

(51 citation statements)

References 6 publications

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“…The unknown current distribution k(j) can be approximated by discretization of the entire contact area into smaller panels (see Figure 2; left) and assuming a constant current distribution on each panel. By applying the Method of Moments [9], a set of linear equations can be found from which we can solve a piecewise constant approximation of the current distribution [3]. From this solution, we can then easily find the resistance network we were looking for.…”

Section: Boundary Element Methodsmentioning

confidence: 99%

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Substrate Resistance Modeling by Combination of BEM and FEM Methodologies

Schrik

Meijs

2004

Scientific Computing in Electrical Engineering

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Abstract. In present-day IC's, substrate noise can have a significant impact on performance. Thus, modeling the noise-propagation characteristics of the substrate is becoming ever more important. Two ways of obtaining such a model are the Finite Element Method (FEM) and the Boundary Element Method (BEM). The FEM makes a full 3D discretization of the entire substrate and is very accurate and flexible, but, in general, it is also slow. The BEM only discretizes contact areas on the substrate-boundary, and is usually faster, but less flexible, because it assumes the substrate to consist of uniform layers. Sometimes, layout-dependent doping patterns near the top of the substrate may also play a significant role in noise-propagation. The FEM would easily be able to model such patterns, but it can often be too slow. The BEM, on the other hand, might not always be accurate enough. This paper describes a combination between BEM and FEM, which results in a method that is faster than FEM but more accurate than BEM. Through a number of experiments, the method is validated and successfully verified against 2 commercially available tools.

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Section: Boundary Element Methodsmentioning

confidence: 99%

“…Similarly, in digital designs, substrate noise can have influence on the clock generator (typically a Phase-Locked Loop, PLL) causing fluctuations in the clock frequency (clock jitter). Thus, modeling the noise-propagation characteristics of the substrate is becoming ever more important [1][2][3].…”

Section: Introductionmentioning

confidence: 99%

Substrate Resistance Modeling by Combination of BEM and FEM Methodologies

Schrik

Meijs

2004

Scientific Computing in Electrical Engineering

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“…To predict any problems in circuit performance caused by substrate noise, there is an increasing need for accurate models that describe the noise-propagation behaviour of the substrate [1,2,3,4,5,6,7,8,9,10]. Such models are usually obtained through either the Finite Element Method (FEM) as applied in e.g.…”

Section: Introductionmentioning

confidence: 99%

Theoretical and practical validation of combined BEM/FEM substrate resistance modeling

Schrik

Dewilde

Meijs

2002

Proceedings of the 2002 IEEE/ACM International Conference on Computer-Aided Design - ICCAD '02

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In mixed-signal designs, substrate noise originating from the digital part can seriously influence the functionality of the analog part. As such, accurately modeling the properties of the substrate as a noise-propagator is becoming ever more important. A model can be obtained through the Finite Element Method (FEM) or the Boundary Element Method (BEM). The FEM performs a full 3D discretization of the substrate, which makes this method very accurate and flexible but also slow. The BEM only discretizes the contact areas on the boundary of the substrate, which makes it less flexible, but significantly faster. A combination between BEM and FEM can be efficient when we need flexibility and speed at the same time. This paper briefly describes the BEM and the FEM and their combination, but mainly concentrates on the theoretical validation of the combined method and the experimental verification through implementation in the SPACE layout to circuit extractor and comparison with commercial BEM and FEM tools.

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“…In BEM methods, only the surface of the substrate contacts is discretized which leads to a system of equations that corresponds to small but full matrices. Extraction of such models requires intensive computations which restrains the range of applicability of this method to small and medium sized circuits [Smedes et al, 1995;Gharpurey and Meyer, 1995;Verghese and Allstot, 1995]. Fortunately, significant progress in BEM methods performance has been lately achieved [Costa et al, 1998;Chou and White, 1998;Kanapka et al, 2000].…”

Section: Previous Workmentioning

confidence: 99%