Extracting Complex Dielectric Properties From Reflection-Transmission Mode Spectroscopy

Sun, Jingye; Lucyszyn, S.

doi:10.1109/access.2018.2797698

Cited by 27 publications

(46 citation statements)

References 36 publications

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“…Some free‐space methods comprise a vector network analyzer (VNA) with pairs of vector network analyzer extenders (VNAXs) and standard gain horns (SGHs) . The measurement frequency of these methods can reach up to 1.1 THz, and they should be able to achieve higher frequencies when the corresponding VNAXs and SGHs are available in the future.…”

Section: Introductionmentioning

confidence: 99%

“…However, the complex relative permittivity is not expressed explicitly, and thus some necessary procedures need to be carried out to resolve the problem. For References , the calculations are carried out using iterative algorithms. The iterative calculations require considerable computational resources and computation time, which grow worse if approximate property values are not known.…”

Section: Introductionmentioning

confidence: 99%

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Terahertz free‐space dielectric property measurements using time‐ and frequency‐domain setups

Ruan

Chan

2019

Int J RF Microw Comput Aided Eng

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Based on a simple and effective calculation method, two free‐space measurement setups are employed to investigate the dielectric properties of various materials at terahertz (THz) frequencies. One setup involves THZ time‐domain spectroscopy (THz‐TDS) at a frequency range of 0.4 to 1 THz. The other setup comprises a vector network analyzer (VNA) with pairs of VAN extenders (VNAXs) and diagonal standard gain horns (SGHs) at a frequency range of 0.22 to 1.1 THz. The calculation method is verified for the THz‐TDS system and employed in the VNA system for the first time. Dielectric properties, including refractive indices, power absorption coefficients, relative permittivities, and loss tangents, are calculated from measured transmission data. Several materials, including printed circuit boards and 3D printing materials, are characterized to verify the calculation method and compare the measurement setups.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Terahertz free‐space dielectric property measurements using time‐ and frequency‐domain setups

Ruan

Chan

2019

Int J RF Microw Comput Aided Eng

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“…With reference to Fig. 12, it can be shown that, using the heuristic engineering approach for vector voltage waves [22], the resulting S-parameters expressions (superscript has been removed for clarity) are: (13). Moreover, neither the source reflection coefficient or any phase information for the directional couplers are required.…”

Section: B Waveguide Reflectometer Analysismentioning

confidence: 99%

Benchmarking a Commercial (Sub-)THz Focal Plane Array Against a Custom-Built Millimeter-Wave Single-Pixel Camera

Shin

Lucyszyn

2020

IEEE Access

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For the first time, the characteristics of an evolving commercial camera technology that can operate at millimeter-wave frequencies has been independently investigated. In this work, we benchmark the TeraSense camera against a custom-built single-pixel camera at W-band, for image quality and aperture reflectance. It is found that the Tera-1024 TeraSense camera exhibits limited image resolution and fidelity, with significant levels of systematic spatial noise. In a poor signal-to-noise ratio scenario, the addition of random noise exacerbates these problems. Possible causes of both beam and image distortion have been identified in quasi-optical applications, which gives important insight into the best use of (sub-)THz cameras and interpretation of their images. Inherent standing waves caused by the significant power reflectance of the camera aperture is investigated in detail. A simple W-band one-port quasi-optical scalar network analyzer is developed, to determine the levels of reflectance for both cameras, with its bespoke calibration routine derived from first principlesproviding a low-cost solution for many non-destructive testing applications. It is found that the TeraSense camera (with additional RAM) and single-pixel camera (having default RAM) have measured reflectance values of 27% and 3%, respectively, over a corresponding aperture area ratio of approximately 714:1. While our single-pixel camera provides excellent image resolution and fidelity, it inherently suffers from very slow raster-scanning speeds and operational bandwidth limitations. For this reason, the TeraSense camera technology is excellent for performing qualitative measurements in real time, with the caveats outlined in this paper.

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“…This allows us to interpret G µν (x) as the Green function of the Helmholtz equation for a monochromatic electromagnetic field, propagating in an arbitrary medium, whose properties are described by the dielectric function ε(ω, x) [46]. This result also gives us the possibility to consider the effects and properties of the medium from a macroscopic point of view only, through the dielectric function ε(ω, x), which can be calculated, and experimentally measured, using different techniques [51][52][53]. We can then rewrite Eq.…”

Section: A Fourier Representation Of the Dressed Photon Propagatormentioning

confidence: 99%

Path-integral description of quantum nonlinear optics in arbitrary media

2019

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We present a method, based on Feynman path integrals, to describe the propagation and properties of the quantised electromagnetic field in an arbitrary, nonlinear medium. We provide a general theory, valid for any order of optical nonlinearity, and we then specialise the the case of second order nonlinear processes. In particular, we show, that second-order nonlinear processes in arbitrary media, under the undepleted pump approximation, can be described by an effective free electromagnetic field, propagating in a vacuum, dressed by the medium itself. Moreover, we show,that the probability of such processes to occur is related to the biphoton propagator, which contains informations about the structure of the medium, its nonlinear properties, and the structure of the pump beam.

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Extracting Complex Dielectric Properties From Reflection-Transmission Mode Spectroscopy

Cited by 27 publications

References 36 publications

Terahertz free‐space dielectric property measurements using time‐ and frequency‐domain setups

Terahertz free‐space dielectric property measurements using time‐ and frequency‐domain setups

Benchmarking a Commercial (Sub-)THz Focal Plane Array Against a Custom-Built Millimeter-Wave Single-Pixel Camera

Path-integral description of quantum nonlinear optics in arbitrary media

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