Spatially-controlled cell adhesion on electron microscopy (EM) supports remains a bottleneck in specimen preparation for cellular cryo-electron tomography. Here, we describe contactless and maskfree photo-micropatterning of EM grids for site-specific deposition of extracellular matrix-related proteins. We attained refined cell positioning for micromachining by cryo-focused ion beam milling.Complex patterns generated predictable intracellular organization, allowing direct correlation between cell architecture and in-cell 3D-structural characterization of the underlying molecular machinery.
MainIn parallel to the ongoing resolution revolution in cryo-electron microscopy for macromolecular structure determination 1 , cryo-electron tomography (ET) has matured to reveal the molecular sociology in situ sensu stricto 2-4 . Yet, cryo-ET of adherent mammalian cells can only be directly performed on their thin peripheries (< 300 nm). To reveal function-related structural variation, conformational states and function-related assemblies of macromolecules at the cell interior, thinning by advanced cryo-focused ion beam (FIB) has proved an optimal, artifact-free preparation method 2,5,6 .Specimen preparation for cellular cryo-ET, whether performed directly on thin cellular peripheries or following cryo-FIB micromachining, involves seeding of adherent cells directly on EM grids made of a biocompatible metal, e.g. gold. Standard EM grids are 3 mm diameter metal meshes overlaid with a delicate perforated thin film. Cells are typically allowed to spread, subjected to genetic or molecular perturbation to represent different physiological settings to be examined in molecular detail, that are then arrested by vitrification 7 . For cells to be thinned by cryo-FIB, they must be positioned roughly at the center of an individual grid square (Fig. 1a) 6 , within a few squares away from the grid center. Whilst the first requirement is necessary to allow access to cellular material for ablation by the FIB, the latter is posed by the subsequent requirement of stage tilt in the transmission electron microscope (TEM) for