2021
DOI: 10.3390/nano11102545
|View full text |Cite
|
Sign up to set email alerts
|

Extensive Broadband Near-Infrared Emissions from GexSi1−x Alloys on Micro-Hole Patterned Si(001) Substrates

Abstract: Broadband near-infrared (NIR) luminescent materials have been continuously pursued as promising candidates for optoelectronic devices crucial for wide applications in night vision, environment monitoring, biological imaging, etc. Here, graded GexSi1−x (x = 0.1–0.3) alloys are grown on micro-hole patterned Si(001) substrates. Barn-like islands and branch-like nanostructures appear at regions in-between micro-holes and the sidewalls of micro-holes, respectively. The former is driven by the efficient strain relat… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
3
0

Year Published

2022
2022
2023
2023

Publication Types

Select...
2
1

Relationship

2
1

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 37 publications
0
3
0
Order By: Relevance
“…In general, the smaller QDs, the less strain relaxation . Accordingly, the lattice mismatch between Ge and Si facilitates the formation of defects, involving stacking faults. For multilayer growth of LTGe, the accumulation of misfit strain energy promotes the formation of the big QDs with a larger R ( R = 0.20), as demonstrated in Figure (b). This is consistent with previous reports. , Meanwhile, it also stimulates the formation of stacking faults in subsequent LTGe.…”
Section: Resultsmentioning
confidence: 97%
“…In general, the smaller QDs, the less strain relaxation . Accordingly, the lattice mismatch between Ge and Si facilitates the formation of defects, involving stacking faults. For multilayer growth of LTGe, the accumulation of misfit strain energy promotes the formation of the big QDs with a larger R ( R = 0.20), as demonstrated in Figure (b). This is consistent with previous reports. , Meanwhile, it also stimulates the formation of stacking faults in subsequent LTGe.…”
Section: Resultsmentioning
confidence: 97%
“…28 Accordingly, the lattice mismatch between Ge and Si facilitates the formation of defects, involving stacking faults. [29][30][31][32] For multilayer growth of LTGe, the accumulation of mis t strain energy promotes the formation of the big QDs, as demonstrated in Fig. 1b.…”
Section: Structural Characteristics Of Ltgementioning
confidence: 97%
“…Additionally, the emission efficiency has been noticeably boosted by intensified hole injection (contribution 39) and spatial light modulation (contribution 40,41) with the existence of nanomaterials for light emitting and terahertz devices. In addition to light-emitting devices, nanomaterials have been widely witnessed in energy conversion devices and the synthesis of nanocomposites (contribution 42-44), and elaborately designed (contribution 45) nanostructures provide a facile approach for the enhancement of the conversion efficiency for Li-ion batteries and solar cells.…”
mentioning
confidence: 99%