Extending the measurement capabilities of 3D X-ray microscopy to dimensional metrology
Herminso Villarraga-Gómez,
Naomi Kotwal,
Robert Zarnetta
Abstract:In the industry of manufactured and assembled devices, the miniaturization and integration of small components with feature sizes on the order of 10 mm or smaller leads to new demands for inspection measurement systems. There are requirements for higher levels of resolution, precision, and accuracy, ideally with technologies that measure internal features and avoid causing damage to the original device. Three-dimensional (3D) techniques such as X-ray computed tomography (CT) may be used to non-destructively in… Show more
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