Extended Oxide-Trap extraction method to low frequencies for irradiated MOS transistors

Djezzar, Boualem; Smatti, A.; Oussalah, Slimane

doi:10.1109/icm.2003.237972

Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442) 2003

DOI: 10.1109/icm.2003.237972

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Extended Oxide-Trap extraction method to low frequencies for irradiated MOS transistors

Boualem Djezzar¹,

A. Smatti²,

Slimane Oussalah³

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Extended Oxide-Trap extraction method to low frequencies for irradiated MOS transistors

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