2014
DOI: 10.1103/physrevlett.113.063201
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Extended Mermin Method for Calculating the Electron Inelastic Mean Free Path

Abstract: We propose an improved method for calculating electron inelastic mean free paths (IMFPs) in solids from experimental energy-loss functions based on the Mermin dielectric function. The "extended Mermin" method employs a nonlimited number of Mermin oscillators and allows negative oscillators to take into account not only electronic transitions, as is common in the traditional approaches, but also infrared transitions and inner shell electron excitations. The use of only Mermin oscillators naturally preserves two… Show more

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Cited by 62 publications
(61 citation statements)
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References 38 publications
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“…) by considering Levine–Louie dielectric function instead of the Lindhard dielectric function. Da et al have proposed an extended Mermin method, which seems to be more reasonable for low energy electrons for correction of non‐Born effect. However, all these models have ignored phonon excitation.…”
Section: Resultsmentioning
confidence: 99%
“…) by considering Levine–Louie dielectric function instead of the Lindhard dielectric function. Da et al have proposed an extended Mermin method, which seems to be more reasonable for low energy electrons for correction of non‐Born effect. However, all these models have ignored phonon excitation.…”
Section: Resultsmentioning
confidence: 99%
“…Da et al . proposed an extended Mermin model for the dielectric function . In their algorithm, the ELF of a material in the optical limit ( q = 0) is obtained by a fit to the experimental ELF with a summation of Mermin‐type ELFs, normalInormalm{}1εq=0,ω=truetrue∑i=1NainormalInormalm{}1εnormalMq=0,ω;ωpi,γitruetrue∑i=1Naiγiω0.1emωnormalpi2ω2ωpi22+γi2ω2, where ε M ( q = 0, ω ; ω p i , γ i ) is the Mermin dielectric function .…”
Section: Inelastic Mean Free Path Calculationsmentioning
confidence: 99%
“…We also performed IMFP calculations for water by using the SPA and the SSPA (and the same optical ELF as for our FPA calculations) to determine the effects of algorithm choice on the resulting IMFPs. We determined ELFs for q > 0 from the optical ELF (where q = 0) with the extended Mermin model proposed by Da et al . to determine differences between the resulting IMFPs and those obtained with the FPA.…”
Section: Introductionmentioning
confidence: 99%
“…The thicknesses t of the Ta 2 O 5 films were 25 (1), 36 (1), 45 (1), 58 (1), 75 (1), 95 (2), 110 (3), and 173 (3) nm. The roughness was 0.5 nm for films with t ≤ 95 nm, and the average mass density was 8.22 (0.06) g/cm 3 , where the uncertainty was given by the standard deviation of the density values in the fits. For films with t = 110 and 173 nm, in which the use of the reflectivity technique is not appropriate, their thicknesses were estimated by comparing the widths of the Ta structure in the Rutherford backscattering (RBS) spectra with the respective ones obtained for thinner films.…”
Section: Experimental Determination Of the Energy Loss Of H And Hementioning
confidence: 99%