Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP) 2019
DOI: 10.1364/isa.2019.ith1c.3
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Extended Focused Image in White Light Scanning Interference Microscopy

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(2 citation statements)
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“…To find the location of artifacts, we use templates that resemble their typical shape. Among the properties of these artifacts, we find that dust particles are made of a single material, and their projections are approximately monochromatic [12]. Dust artifacts are darker in the center, and their opacity is attenuated far from the center, and most of them are approximately circular in shape [9].…”
Section: Artifact Localization Via Cross-correlation Non-maxima Suppression and Spatial Matchingmentioning
confidence: 99%
See 1 more Smart Citation
“…To find the location of artifacts, we use templates that resemble their typical shape. Among the properties of these artifacts, we find that dust particles are made of a single material, and their projections are approximately monochromatic [12]. Dust artifacts are darker in the center, and their opacity is attenuated far from the center, and most of them are approximately circular in shape [9].…”
Section: Artifact Localization Via Cross-correlation Non-maxima Suppression and Spatial Matchingmentioning
confidence: 99%
“…However, this detection approach requires careful scanning through many possible focus positions. Also, the removal stage is based on a fusion approach from the stack of images typically used in microscopy [12]. Alternatively, Zhou and Lin [13] propose the detection of dust candidate regions via an optimization approach to estimate a dust-free image.…”
Section: Introductionmentioning
confidence: 99%