Exploring the Surface Sensitivity of TOF-Secondary Ion Mass Spectrometry by Measuring the Implantation and Sampling Depths of Bi<sub>n</sub> and C<sub>60</sub> Ions in Organic Films

Muramoto, Shin; Brison, J.; Castner, David G.

doi:10.1021/ac202713k

Cited by 64 publications

(90 citation statements)

References 62 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Participant C used 60 keV Bi 3 2+ and participant D used 15 keV Bi 3 + , which is a factor-of-4 difference in energy with an ∼2 nm difference in depth resolution. Muramoto et al 22 reported an information depth increase for organic materials of ∼1 nm on changing analysis beam energies by a factor of 2 from 25 keV Bi 3 + to 50 keV Bi 3 2+ . In the previous VAMAS study on organic depth profiling, empirical relationships between C 60 q+ energy, sputtering yield, and depth resolution were established.…”

Section: ■ Results and Discussionmentioning

confidence: 99%

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

et al. 2012

View full text Add to dashboard Cite

The depth profiling of organic materials with argon cluster ion sputtering has recently become widely available with several manufacturers of surface analytical instrumentation producing sources suitable for surface analysis. In this work, we assess the performance of argon cluster sources in an interlaboratory study under the auspices of VAMAS (Versailles Project on Advanced Materials and Standards). The results are compared to a previous study that focused on C(60)(q+) cluster sources using similar reference materials. Four laboratories participated using time-of-flight secondary-ion mass spectrometry for analysis, three of them using argon cluster sputtering sources and one using a C(60)(+) cluster source. The samples used for the study were organic multilayer reference materials consisting of a ∼400-nm-thick Irganox 1010 matrix with ∼1 nm marker layers of Irganox 3114 at depths of ∼50, 100, 200, and 300 nm. In accordance with a previous report, argon cluster sputtering is shown to provide effectively constant sputtering yields through these reference materials. The work additionally demonstrates that molecular secondary ions may be used to monitor the depth profile and depth resolutions approaching a full width at half maximum (fwhm) of 5 nm can be achieved. The participants employed energies of 2.5 and 5 keV for the argon clusters, and both the sputtering yields and depth resolutions are similar to those extrapolated from C(60)(+) cluster sputtering data. In contrast to C(60)(+) cluster sputtering, however, a negligible variation in sputtering yield with depth was observed and the repeatability of the sputtering yields obtained by two participants was better than 1%. We observe that, with argon cluster sputtering, the position of the marker layers may change by up to 3 nm, depending on which secondary ion is used to monitor the material in these layers, which is an effect not previously visible with C(60)(+) cluster sputtering. We also note that electron irradiation, used for charge compensation, can induce molecular damage to areas of the reference samples well beyond the analyzed region that significantly affects molecular secondary-ion intensities in the initial stages of a depth profile in these materials.

show abstract

Section: ■ Results and Discussionmentioning

confidence: 99%

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

et al. 2012

View full text Add to dashboard Cite

show abstract

“…On the other hand, the mass m/z 26.3 (CN -) was specific from healthy samples (30). CN -is a marker of protein content and it has been associated to protein rich tissues areas (31). Cell death and tissue destruction are typical phenomena of the OA disease.…”

Section: Pca Revealed the Presence Of Droplets Rich In Lipids In Oa Cmentioning

confidence: 99%

Time-of-Flight Secondary Ion Mass Spectrometry-Based Molecular Distribution Distinguishing Healthy and Osteoarthritic Human Cartilage

et al. 2012

View full text Add to dashboard Cite

ABSTRACT. Osteoarthritis (OA) is a pathology that ultimately causes joint destruction.The cartilage is one of the principal affected tissues. Alterations in the lipid mediators and an imbalance in the metabolism of cells that form the cartilage (chondrocytes), have been described as contributors to the OA development. In this study, we have studied the distribution of lipids and chemical elements in healthy and OA human cartilage. Time of flight secondary ion mass spectrometry (TOF-SIMS) allows us to study the spatial distribution of molecules at a high resolution on a tissue section. TOF-SIMS revealed a specific peak profile that distinguishes healthy from OA cartilages. The spatial distribution of cholesterol-related peaks exhibited a remarkable difference between healthy and OA cartilages. A distinctive co-localization of cholesterol and other lipids in the superficial area of the cartilage was found. A higher intensity of oleic acid and other fatty acids in the OA cartilages exhibited a similar localization. On the other hand, CNwas observed with a higher intensity in the healthy samples. Finally, we observed an accumulation of calcium and phosphate ions exclusively in areas surrounding the chondrocyte in OA tissues. To our knowledge, this is the first time that TOF-SIMS revealed combined changes in the molecular distribution in the OA human cartilage.

show abstract

“…Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a surface analytical technique that has been widely used to study a range of biological samples including proteins [37–40], lipids [41], DNA microarrays [42], cultured cells [43,44], along with soft [45–47], hard [48] and decellularized tissues [7,8]. In ToF-SIMS a primary ion beam (in this study Bi 3 + ) is used to impact the surface of interest, yielding characteristic fragments from the top few nanometers of the surface.…”

Section: Introductionmentioning

confidence: 99%

Revealing cytokine-induced changes in the extracellular matrix with secondary ion mass spectrometry

et al. 2015

View full text Add to dashboard Cite

Cell-secreted matrices (CSMs), where extracellular matrix (ECM) deposited by monolayer cell cultures are decellularized, have been increasingly used to produce surfaces that may be reseeded with cells. Such surfaces are useful to help us understand cell-ECM interactions in a microenvironment closer to the in vivo situation than synthetic substrates with adsorbed proteins. We describe the production of CSMs from mouse primary osteoblasts (mPObs) exposed to cytokine challenge during matrix secretion, mimicking in vivo inflammatory environments. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) data revealed that CSMs with cytokine challenge at day 7 or day 12 of culture can be chemically distinguished from one another and from untreated CSM using multivariate analysis. Comparison of the differences with reference spectra from adsorbed protein mixtures points towards cytokine challenge resulting in a decrease in collagen content. This is supported by immunocytochemical and histological staining, demonstrating a 44% loss of collagen mass and a 32% loss in collagen I coverage. CSM surfaces demonstrate greater cell adhesion than adsorbed ECM proteins. When mPObs were reseeded onto cytokine-challenged CSMs they exhibited reduced adhesion and elongated morphology compared to untreated CSMs. Such changes may direct subsequent cell fate and function and provide insights into pathological responses at sites of inflammation.

show abstract

Exploring the Surface Sensitivity of TOF-Secondary Ion Mass Spectrometry by Measuring the Implantation and Sampling Depths of Bi_n and C₆₀ Ions in Organic Films

Cited by 64 publications

References 62 publications

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Time-of-Flight Secondary Ion Mass Spectrometry-Based Molecular Distribution Distinguishing Healthy and Osteoarthritic Human Cartilage

Revealing cytokine-induced changes in the extracellular matrix with secondary ion mass spectrometry

Contact Info

Product

Resources

About

Exploring the Surface Sensitivity of TOF-Secondary Ion Mass Spectrometry by Measuring the Implantation and Sampling Depths of Bin and C60 Ions in Organic Films

Cited by 64 publications

References 62 publications

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Time-of-Flight Secondary Ion Mass Spectrometry-Based Molecular Distribution Distinguishing Healthy and Osteoarthritic Human Cartilage

Revealing cytokine-induced changes in the extracellular matrix with secondary ion mass spectrometry

Contact Info

Product

Resources

About

Exploring the Surface Sensitivity of TOF-Secondary Ion Mass Spectrometry by Measuring the Implantation and Sampling Depths of Bi_n and C₆₀ Ions in Organic Films