2023
DOI: 10.3390/ma16083203
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Exploring the Piezoelectric Properties of Bismuth Ferrite Thin Films Using Piezoelectric Force Microscopy: A Case Study

Abstract: Over recent decades, the scientific community has managed to make great progress in the theoretical investigation and practical characterization of bismuth ferrite thin films. However, there is still much work to be completed in the field of magnetic property analysis. Under a normal operational temperature, the ferroelectric properties of bismuth ferrite could overcome the magnetic properties due to the robustness of ferroelectric alignment. Therefore, investigation of the ferroelectric domain structure is cr… Show more

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Cited by 4 publications
(2 citation statements)
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“…In the initial state of the regions (outer side), phase maps of the PZT films on Pt/Si substrates displayed a uniform distribution, alternating between purple and bright yellow. This indicates that the polarization directions in these areas were randomly distributed (see Figure 5a) [29]. Conversely, in the case of PZT films grown on LNO/Mica and Pt/Mica substrates, the color in the outer regions corresponded to the inner regions polarized in the positive direction.…”
Section: Pt/mica Submentioning
confidence: 96%
“…In the initial state of the regions (outer side), phase maps of the PZT films on Pt/Si substrates displayed a uniform distribution, alternating between purple and bright yellow. This indicates that the polarization directions in these areas were randomly distributed (see Figure 5a) [29]. Conversely, in the case of PZT films grown on LNO/Mica and Pt/Mica substrates, the color in the outer regions corresponded to the inner regions polarized in the positive direction.…”
Section: Pt/mica Submentioning
confidence: 96%
“…Homoepitaxy refers to a film that shares the same crystallographic orientation and composition as the substrate, effectively extending the substrate itself [ 5 , 6 ]. Conversely, in heteroepitaxy, the substrate closely matches the orientation of the deposited monolayer.…”
Section: Growth Mechanisms Of Thin Filmsmentioning
confidence: 99%